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2011 | OriginalPaper | Chapter

2. The Principles of STEM Imaging

Author : Peter D. Nellist

Published in: Scanning Transmission Electron Microscopy

Publisher: Springer New York

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Abstract

The principles underlying imaging in the scanning transmission electron microscope are described. Particular focus is made on bright-field and annular dark-field imaging modes to illustrate the difference between coherent and incoherent imaging. In the case of annular dark-field imaging, the effects of dynamical diffraction and thermal diffuse scattering are discussed. The extension to three-dimensional imaging by optical sectioning is included, with particular reference to resolution limits and the bounds of transfer.

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Title: The Principles of STEM Imaging
Author: Peter D. Nellist
Publisher: Springer New York
Book: Scanning Transmission Electron Microscopy
Print ISBN: 978-1-4419-7199-9

Electronic ISBN: 978-1-4419-7200-2

Copyright Year: 2011
DOI: https://doi.org/10.1007/978-1-4419-7200-2_2