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Journal of Electronic Testing

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14-10-2022

Using both Stable and Unstable SRAM Bits for the Physical Unclonable Function

Authors: Zhi-Wei Lai, Po-Hua Huang, Kuen-Jong Lee

Published in: Journal of Electronic Testing | Issue 5/2022

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Abstract

Recently Physical Unclonable Functions (PUFs) of IC chips have been used in electronic systems for secret key generation and device authentication. Among all available PUFs, SRAM PUF is a popular one because SRAM is a standard component for most electronic devices, and it possesses good randomness during power-on. Previously only strongly stable SRAM bits are selected as PUF bits, which generally requires a large number of SRAM bits. Furthermore, SRAM PUFs may suffer from PUF clone attacks as attackers may use the Photon Emission Analysis (PEA) device to observe the behavior of stable bits and conduct circuit edit via Focused Ion Beam (FIB) to produce identical PUFs. In this paper we propose two methods that employ unstable bits as PUF bits in addition to stable bits to increase the SRAM bit usage rate. These two methods can resist the PUF clone attack as it is very difficult to reproduce unstable bits. Extensive experiments have been conducted, and the results show that though unstable bits are used, high reliability is still achieved.

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Maiti A, Casarona J, McHale L, Schaumont P (2010) “A large scale characterization of RO-PUF,” in Proc. IEEE International Symposium on Hardware-Oriented Security and Trust (HOST), pp. 94–99, https://doi.org/10.1109/HST.2010.5513108

Liu W, Zhang L, Zhang Z, Gu C, Wang C, O’Neill M, Lombardi F (2019) XOR-based low-cost reconfigurable PUFs for IoT security. ACM Trans Embedded Comput Syst (TECS) 18(3):1–21. https://doi.org/10.1145/3274666CrossRef

Herder C, Yu M, Koushanfar F, Devadas S (2014) “Physical unclonable functions and applications: A Tutorial,” Proc. of the IEEE, vol. 102, no. 8, pp. 1126–1141, https://doi.org/10.1109/JPROC.2014.2320516

Gu C, Liu W, Cui Y, Hanley N, O’Neill M, Lombardi F (2019) A flip-flop based arbiter physical unclonable function (APUF) design with high entropy and uniqueness for FPGA implementation. IEEE Trans Emerg Top Comput 9(4):1853–1866. https://doi.org/10.1109/TETC.2019.2935465CrossRef

Tuyls P, Schrijen G-J, Škorić B, Van Geloven J, Verhaegh N, Wolters R (2006) “Read-proof hardware from protective coatings,” in Proc. International Workshop on Cryptographic Hardware and Embedded Systems, vol. 4249, pp. 369–383. https://doi.org/10.1007/11894063_29

Kumar SS, Guajardo J, Maes R, Schrijen G, Tuyls P (2008) “Extended abstract: The butterfly PUF protecting IP on every FPGA,” in Proc. IEEE International Workshop on Hardware-Oriented Security and Trust, pp. 67–70. https://doi.org/10.1109/HST.2008.4559053

Wu M, Yang T, Chen L, Lin C, Hu H, Su F, Wang C, Huang JP, Chen H, Lu CC, Yang EC, Shen RS (2018) “A PUF scheme using competing oxide rupture with bit error rate approaching zero,” in Proc. IEEE International Solid-State Circuits Conference - (ISSCC), pp. 130–132. https://doi.org/10.1109/ISSCC.2018.8310218

Handschuh H “Hardware-anchored security based on SRAM PUFs, Part 1,”IEEE Security & Privacy, vol. 10, no. 3, pp.80–83, May-June 2012. https://doi.org/10.1109/MSP.2012.68

Kazumori K, Ueno R, Homma N (2019) “A ternary fuzzy extractor for efficient cryptographic key generation,” in Proc. IEEE International Symposium on Multiple-Valued Logic (ISMVL), pp. 49–54. https://doi.org/10.1109/ISMVL.2019.00017

10.

Mathew SK, Satpathy SK, Anders MA, Kaul H, Hsu SK, Agarwal A, Chen GK, Parker RJ, Krishnamurthy RK, De V (2014) “A 0.19pJ/b PVT-variation-tolerant hybrid physically unclonable function circuit for 100% stable secure key generation in 22nm CMOS,” in Proc. IEEE International Solid-State Circuits Conference (ISSCC), pp. 278–279. https://doi.org/10.1109/ISSCC.2014.6757433

11.

Satpathy S, Mathew SK, Suresh V, Anders MA, Kaul H, Agarwal A, Hsu SK, Chen G, Krishnamurthy RK, De VK (April 2017) A 4-fJ/b delay-hardened physically unclonable function circuit with selective bit destabilization in 14-nm trigate CMOS. IEEE J Solid-State Circuits 52(4):940–949. https://doi.org/10.1109/JSSC.2016.2636859

12.

Jang J, Ghosh S (2015) “Design and analysis of novel SRAM PUFs with embedded latch for robustness,” in Proc. International Symposium on Quality Electronic Design, pp. 298–302. https://doi.org/10.1109/ISQED.2015.7085443

13.

Zhou C, Satapathy S, Lao Y, Parhi KK, Kim CH (2016) “Soft response generation and thresholding strategies for linear and feed-forward MUX PUFs,” in Proc. International Symposium on Low Power Electronics and Design, pp. 124–129. https://doi.org/10.1145/2934583.2934613

14.

Xiao K, Rahman MT, Forte D, Huang Y, Su M, Tehranipoor M (2014) “Bit selection algorithm suitable for high-volume production of SRAM-PUF,” in Proc. IEEE International Symposium on Hardware-Oriented Security and Trust (HOST), pp. 101–106. https://doi.org/10.1109/HST.2014.6855578

15.

Liu M, Zhou C, Tang Q, Parhi KK, Kim CH (2017) “A data remanence based approach to generate 100% stable keys from an SRAM physical unclonable function,” in Proc. IEEE/ACM International Symposium on Low Power Electronics and Design (ISLPED), pp. 1–6. https://doi.org/10.1109/ISLPED.2017.8009192

16.

Saraza-Canflanca P, Carrasco-Lopez H, Santana-Andreo A, Brox P, Castro-Lopez R, Roca E, Fernandez FV (2021) Improving the reliability of SRAM-based PUF under varying operation conditions and aging degradation. Microelectron Reliab 118(114049). https://doi.org/10.1016/j.microrel.2021.114049

17.

Wang W, Singh AD, Guin U (2022) A systematic bit selection method toward robust and unique SRAM PUFs. J Electron Testing: Theory Appl (JETTA) 38(3):235-246. https://doi.org/10.1007/s10836-022-06006-x

18.

Rührmair U, Sölter J (2014) “PUF modeling attacks: An introduction and overview,” in Proc. Design, Automation & Test in Europe Conference & Exhibition (DATE), pp. 1–6. https://doi.org/10.7873/DATE. 2014.361

19.

Wei S, Wendt JB, Nahapetian A, Potkonjak M (2014) “Reverse engineering and prevention techniques for physical unclonable functions using side channels,” in Proc. Design Automation Conference, pp. 1–6. https://doi.org/10.1145/2593069.2593204

20.

Helfmeier C, Boit C, Nedospasov D, Seifert J (2013) “Cloning physically unclonable functions,” in Proc. IEEE International Symposium on Hardware-Oriented Security and Trust (HOST), pp. 1–6. https://doi.org/10.1109/HST.2013.6581556

21.

Cambou B, Orlowski M (2016) “PUF designed with resistive RAM and ternary states,” in Proc. Cyber and Information Security Research Conference, pp. 1–8. https://doi.org/10.1145/2897795. 2897808

22.

Korenda AR, Afghah F, Cambou B (2018) “A secret key generation scheme for Internet of Things using ternary-states ReRAM-based physical unclonable functions,” in Proc. International Wireless Communications & Mobile Computing Conference (IWCMC), pp. 1261–1266. https://doi.org/10.1109/IWCMC.2018.8450341

23.

Mohammadinodoushan M, Cambou B, Philabaum C, Hely D, Booher DD (2019) “Implementation of password management system using ternary addressable PUF generator,” in Proc. IEEE International Conference on Sensing, Communication, and Networking (SECON), pp. 1–8. https://doi.org/10.1109/SAHCN.2019.8824792

24.

Yamamoto D, Sakiyama K, Iwamoto M, Ohta K, Ochiai T, Takenaka M, Itoh K (2011) “Uniqueness enhancement of PUF responses based on the locations of random outputting RS latches,” in Proc. International Workshop on Cryptographic Hardware and Embedded Systems, pp. 390–406. https://doi.org/10.1007/978-3-642-23951-9_26

25.

Lai Z, Lee K (2019) “Using unstable SRAM bits for physical unclonable function applications on off-the-shelf SRAM,” in Proc. IEEE Asia Pacific Conference on Circuits and Systems (APCCAS), pp. 41–44. https://doi.org/10.1109/APCCAS47518.2019.8953143

26.

Maiti A, Schaumont P (2014) The impact of aging on a physical unclonable function. IEEE Trans Very Large Scale Integr VLSI Syst 22(9):1854–1864. https://doi.org/10.1109/TVLSI.2013.2279875

27.

Saxena N, Voris J (2011) Data remanence effects on memory-based entropy collection for RFID systems. Int J Inf Secur 10(4):213–222. https://doi.org/10.1007/s10207-011-0139-0CrossRef

28.

Anagnostopoulos NA, Arul T, Rosenstihl M, Schaller A, Gabmeyer S, Katzenbeisser S (2018) “Low-temperature data remanence attacks against intrinsic SRAM PUFs,” in Proc. Euromicro Conference on Digital System Design (DSD), pp. 581–585. https://doi.org/10.1109/DSD.2018.00102

29.

Tuan T, Strader T, Trimberger S (2007) “Analysis of data remanence in a 90nm FPGA,” in Proc. IEEE Custom Integrated Circuits Conference, pp. 93–96. https://doi.org/10.1109/CICC.2007.4405689

Title: Using both Stable and Unstable SRAM Bits for the Physical Unclonable Function
Authors: Zhi-Wei Lai
Po-Hua Huang
Kuen-Jong Lee
Publication date: 14-10-2022
Publisher: Springer US
Published in: Journal of Electronic Testing / Issue 5/2022
Print ISSN: 0923-8174
Electronic ISSN: 1573-0727
DOI: https://doi.org/10.1007/s10836-022-06025-8

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