Skip to main content
Top
Published in: Journal of Materials Science: Materials in Electronics 7/2010

01-07-2010

A hybrid inverse method for evaluating FC-PBGA material response to thermal cycles

Authors: A. Shirazi, H. Lu, A. Varvani-Farahani

Published in: Journal of Materials Science: Materials in Electronics | Issue 7/2010

Log in

Activate our intelligent search to find suitable subject content or patents.

search-config
loading …

Abstract

This study proposes a hybrid experimental-analytical inverse method that can be used to evaluate thermomechanical cyclic behavior of flip-chip plastic ball grid array modules and the constituent materials. Treating such a package as an adhesively bonded trilayer plate, the structural formulation follows and modifies an existing analytical model. A phase-shifted shadow moiré method is employed to obtain the package thermal warpage variation in responding to a temperature cycle. By correlating the modeling predicted and the experimentally measured package warpage, the application of the method leads to the determination of those uncertain material parameters including temperature dependent modulus of elasticity and coefficient of thermal expansion of the die attachment and the substrate materials. These parameters are difficult to determine otherwise due to the complexity involving the effect of package processing condition and extremely thin thickness of the adhesive layer. As the values of all material parameters are ascertained, shear and peel stresses in the module adhesive layer can also be evaluated based on the analytical model.

Dont have a licence yet? Then find out more about our products and how to get one now:

Springer Professional "Wirtschaft+Technik"

Online-Abonnement

Mit Springer Professional "Wirtschaft+Technik" erhalten Sie Zugriff auf:

  • über 102.000 Bücher
  • über 537 Zeitschriften

aus folgenden Fachgebieten:

  • Automobil + Motoren
  • Bauwesen + Immobilien
  • Business IT + Informatik
  • Elektrotechnik + Elektronik
  • Energie + Nachhaltigkeit
  • Finance + Banking
  • Management + Führung
  • Marketing + Vertrieb
  • Maschinenbau + Werkstoffe
  • Versicherung + Risiko

Jetzt Wissensvorsprung sichern!

Springer Professional "Technik"

Online-Abonnement

Mit Springer Professional "Technik" erhalten Sie Zugriff auf:

  • über 67.000 Bücher
  • über 390 Zeitschriften

aus folgenden Fachgebieten:

  • Automobil + Motoren
  • Bauwesen + Immobilien
  • Business IT + Informatik
  • Elektrotechnik + Elektronik
  • Energie + Nachhaltigkeit
  • Maschinenbau + Werkstoffe




 

Jetzt Wissensvorsprung sichern!

Springer Professional "Wirtschaft"

Online-Abonnement

Mit Springer Professional "Wirtschaft" erhalten Sie Zugriff auf:

  • über 67.000 Bücher
  • über 340 Zeitschriften

aus folgenden Fachgebieten:

  • Bauwesen + Immobilien
  • Business IT + Informatik
  • Finance + Banking
  • Management + Führung
  • Marketing + Vertrieb
  • Versicherung + Risiko




Jetzt Wissensvorsprung sichern!

Appendix
Available only for authorised users
Literature
2.
go back to reference P.S. Ho, G. Wang, M. Ding, J.H. Zhao, X. Dai, Microelectron. Reliab. 44, 719 (2004)CrossRef P.S. Ho, G. Wang, M. Ding, J.H. Zhao, X. Dai, Microelectron. Reliab. 44, 719 (2004)CrossRef
3.
go back to reference S. Chen, C.Z. Tsai, N. Kao, E. Wu, Proc. Electron. Compon. Tech. Conf. 2, 1677 (2005) S. Chen, C.Z. Tsai, N. Kao, E. Wu, Proc. Electron. Compon. Tech. Conf. 2, 1677 (2005)
4.
5.
go back to reference X. Wei, K. Marston, K. Sikka, 11th IEEE Intersoc. Conf. Thermal. Thermomec. Phenom. Electron. Sys., I-THERM, 310 (2008) X. Wei, K. Marston, K. Sikka, 11th IEEE Intersoc. Conf. Thermal. Thermomec. Phenom. Electron. Sys., I-THERM, 310 (2008)
6.
go back to reference S.S. Too, J. Hayward, R. Master, T.S. Tan, K.H. Keok, 57th IEEE Electronic Component & Technol. Conf., 748 (2007) S.S. Too, J. Hayward, R. Master, T.S. Tan, K.H. Keok, 57th IEEE Electronic Component & Technol. Conf., 748 (2007)
7.
go back to reference S. Michaelides, S.K. Sitaraman, IEEE Trans. Adv. Package. 22(4), 602 (1999)CrossRef S. Michaelides, S.K. Sitaraman, IEEE Trans. Adv. Package. 22(4), 602 (1999)CrossRef
8.
go back to reference Y. Li, 53rd IEEE Electronic Component & Technol. Conf., 549 (2003) Y. Li, 53rd IEEE Electronic Component & Technol. Conf., 549 (2003)
10.
go back to reference W. Zhang, D. Wu, B. Su, S.A. Hareb, Y.C. Lee, B.P. Masterson, IEEE Trans. Compon. Packag. Manuf. Technol. 21, 2 (1998)CrossRef W. Zhang, D. Wu, B. Su, S.A. Hareb, Y.C. Lee, B.P. Masterson, IEEE Trans. Compon. Packag. Manuf. Technol. 21, 2 (1998)CrossRef
11.
go back to reference J.W.Y. Kong, J.K. Kim, M.M.F. Yuen, IEEE Trans. Electron. Packag. Manuf. 26(3), 245 (2003)CrossRef J.W.Y. Kong, J.K. Kim, M.M.F. Yuen, IEEE Trans. Electron. Packag. Manuf. 26(3), 245 (2003)CrossRef
12.
go back to reference E. Suhir, Structural Analysis in Microelectronic and Fiber-Optic Systems, 1st edn. (Van Nostrand Reinhold, New York, 1991) E. Suhir, Structural Analysis in Microelectronic and Fiber-Optic Systems, 1st edn. (Van Nostrand Reinhold, New York, 1991)
13.
go back to reference N. Islam, M. Jimarez, R. Darveaux, J. Lee, J. Na, K. Kim, Proc. ASME InterPack Conf., IPACK. 2007(2), 532 (2007) N. Islam, M. Jimarez, R. Darveaux, J. Lee, J. Na, K. Kim, Proc. ASME InterPack Conf., IPACK. 2007(2), 532 (2007)
14.
go back to reference A. Dubey, Proc. Elect. Compon. Technol. Conf., 1907 (2008) A. Dubey, Proc. Elect. Compon. Technol. Conf., 1907 (2008)
15.
go back to reference H. Ding, I.C. Urne, C. Zhang, J. Electron. Package. Trans. ASME 126(2), 265 (2004)CrossRef H. Ding, I.C. Urne, C. Zhang, J. Electron. Package. Trans. ASME 126(2), 265 (2004)CrossRef
16.
go back to reference M.Y. Tsai, C.H.J. Hsu, C.T.O. Wang, IEEE Trans. Compon. Package Tech. 27(3), 568 (2004)CrossRef M.Y. Tsai, C.H.J. Hsu, C.T.O. Wang, IEEE Trans. Compon. Package Tech. 27(3), 568 (2004)CrossRef
17.
go back to reference J.H. Lau, S.W.R. Lee, C. Chang, IEEE Trans. Compon. Package. Technol. 23(2), 323 (2000)CrossRef J.H. Lau, S.W.R. Lee, C. Chang, IEEE Trans. Compon. Package. Technol. 23(2), 323 (2000)CrossRef
18.
go back to reference S.P. Timoshenko, J.N. Goodier, Theory of Elasticity, 31st edn. (McGraw-Hill, New York, 1970)MATH S.P. Timoshenko, J.N. Goodier, Theory of Elasticity, 31st edn. (McGraw-Hill, New York, 1970)MATH
20.
21.
go back to reference R.R. Valisetty, Ph.D. thesis, Georgia Inst. Technol., Atlanta, March (1983) R.R. Valisetty, Ph.D. thesis, Georgia Inst. Technol., Atlanta, March (1983)
23.
24.
go back to reference K. Wang, Y. Huang, A. Chandra, K.X. Hu, Thermomech. Phenom. Electron. Sys., Proc. Inter. Conf. 2, 56 (2000) K. Wang, Y. Huang, A. Chandra, K.X. Hu, Thermomech. Phenom. Electron. Sys., Proc. Inter. Conf. 2, 56 (2000)
27.
28.
go back to reference M.Y. Tsai, C.H. Hsu, C.N. Han, J. Electron. Packag., Trans. ASME 126(1), 115 (2004)CrossRef M.Y. Tsai, C.H. Hsu, C.N. Han, J. Electron. Packag., Trans. ASME 126(1), 115 (2004)CrossRef
29.
go back to reference Y.P. Wang, K. Chai, T.D Her, R. Lo, 3rd IEEE Electronic Packag. & Technol. Conf., 223 (2000) Y.P. Wang, K. Chai, T.D Her, R. Lo, 3rd IEEE Electronic Packag. & Technol. Conf., 223 (2000)
30.
go back to reference S. Park, H.C. Lee, B. Sammakia, K. Raghunathan, IEEE Trans. Compon. Packag. Tech. 30(2), 294 (2007)CrossRef S. Park, H.C. Lee, B. Sammakia, K. Raghunathan, IEEE Trans. Compon. Packag. Tech. 30(2), 294 (2007)CrossRef
31.
go back to reference S. Jayaraman, J. Tang, V.S. Wakharkar, in Microelectronic Packaging, ed. by M. Datta, T. Ōsaka, J.W. Schultze (CRC Press, Boca Raton, FL, 2005), p. 253 S. Jayaraman, J. Tang, V.S. Wakharkar, in Microelectronic Packaging, ed. by M. Datta, T. Ōsaka, J.W. Schultze (CRC Press, Boca Raton, FL, 2005), p. 253
32.
go back to reference F. Zhang, M. Li, W.T. Chen, K.S. Chian, IEEE Trans. Compon. Packag. Technol. 26(1), 233 (2003)CrossRef F. Zhang, M. Li, W.T. Chen, K.S. Chian, IEEE Trans. Compon. Packag. Technol. 26(1), 233 (2003)CrossRef
33.
go back to reference J.H. Okura, K. Darbha, S. Shetty, A. Dasgupta, J.F.J.M. Caers, 49th IEEE Electronic Component & Technol. Conf., 589 (1999) J.H. Okura, K. Darbha, S. Shetty, A. Dasgupta, J.F.J.M. Caers, 49th IEEE Electronic Component & Technol. Conf., 589 (1999)
34.
go back to reference M.Y. Tsai, Y.C. Lin, C.Y. Huang, J.D. Wu, IEEE Trans. Electron. Package Manufact. 28(4), 328 (2005)CrossRef M.Y. Tsai, Y.C. Lin, C.Y. Huang, J.D. Wu, IEEE Trans. Electron. Package Manufact. 28(4), 328 (2005)CrossRef
35.
go back to reference A. Shirazi, H. Lu, A. Varvani-Farahani, Proc. Int. Conf. Solder. Reliab. Tor., May 20–22 (2009) A. Shirazi, H. Lu, A. Varvani-Farahani, Proc. Int. Conf. Solder. Reliab. Tor., May 20–22 (2009)
37.
go back to reference K. Verma, D. Columbus, B. Han, IEEE Trans. Electron. Package Manuf. 22(1), 63 (1999)CrossRef K. Verma, D. Columbus, B. Han, IEEE Trans. Electron. Package Manuf. 22(1), 63 (1999)CrossRef
38.
go back to reference R. Zhao, H. Lu, M. Zhou, C. Sun, in Proceedings of the CSME Forum, May 21–24, Kananaskis, Alberta (2006) R. Zhao, H. Lu, M. Zhou, C. Sun, in Proceedings of the CSME Forum, May 21–24, Kananaskis, Alberta (2006)
39.
go back to reference M. Zhou, H. Lu,in Proceedings of the SMTAI Conference, Orlando, October 7–11, 374 (2007) M. Zhou, H. Lu,in Proceedings of the SMTAI Conference, Orlando, October 7–11, 374 (2007)
40.
go back to reference J.F. Doyle, Modern Experimental Stress Analysis, 1st edn. (John Wiley & Sons, Ltd., West Sussex, England, 2004), pp. 171–218 J.F. Doyle, Modern Experimental Stress Analysis, 1st edn. (John Wiley & Sons, Ltd., West Sussex, England, 2004), pp. 171–218
41.
42.
go back to reference I. DeSousa, H. McCormick, H. Lu, R. Martel, S. Ouimet, Proc. Electron. Compon. Technol. Conf., 397 (2008) I. DeSousa, H. McCormick, H. Lu, R. Martel, S. Ouimet, Proc. Electron. Compon. Technol. Conf., 397 (2008)
43.
Metadata
Title
A hybrid inverse method for evaluating FC-PBGA material response to thermal cycles
Authors
A. Shirazi
H. Lu
A. Varvani-Farahani
Publication date
01-07-2010
Publisher
Springer US
Published in
Journal of Materials Science: Materials in Electronics / Issue 7/2010
Print ISSN: 0957-4522
Electronic ISSN: 1573-482X
DOI
https://doi.org/10.1007/s10854-009-9987-z

Other articles of this Issue 7/2010

Journal of Materials Science: Materials in Electronics 7/2010 Go to the issue