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Published in: Rare Metals 1/2021

18-09-2015

Aging resistance and mechanical properties of Sn3.0Ag0.5Cu solder bump joints with different bump shapes

Authors: Ping Chen, Xiu-Chen Zhao, Ying Liu, Hong Li, Yong Wang

Published in: Rare Metals | Issue 1/2021

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Abstract

The effects of bump shape on the aging resistance and mechanical properties of Sn3.0Ag0.5Cu (SAC) solder bump joints were investigated by high-temperature aging test and shear test. Three different SAC solder bump joints with barrel type, cylinder type, and hourglass type, respectively, were provided by controlling solder process. The results indicate that as the bump volume decreases from barrel bump to hourglass bump in the reflow, the thickness growth rate of intermetallic compounds (IMCs) between different solder joints and Cu substrates in the isothermal aging of 150 °C decreases. And the change of shear strength of hourglass interconnection solder joint with the increase in temperature is the minimum in the three interconnection solder joints. Thus, as the solder dosage decreases properly, hourglass interconnection solder joint is obtained, which is avail to enhance the solder joint reliability at the high-temperature aging and the ability to adapt to the change of environment temperature suddenly.

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Literature
[1]
go back to reference Tummala RR, Rymaszewski EJ, Klopfenstein AG. Microelectronics Packaging Handbook. 2nd ed. New York: International Thompson; 1997. 65.CrossRef Tummala RR, Rymaszewski EJ, Klopfenstein AG. Microelectronics Packaging Handbook. 2nd ed. New York: International Thompson; 1997. 65.CrossRef
[2]
go back to reference Mishiro K, Ishikawa S, Abe M, Kumai T, Higashiguchi Y, Tsubone KI. Effect of the drop impact on BGA/CSP package reliability. Microelectron Reliab. 2002;42(1):77.CrossRef Mishiro K, Ishikawa S, Abe M, Kumai T, Higashiguchi Y, Tsubone KI. Effect of the drop impact on BGA/CSP package reliability. Microelectron Reliab. 2002;42(1):77.CrossRef
[3]
go back to reference Sona M, Prabhu KN. Review on microstructure evolution in Sn–Ag–Cu solders and its effect on mechanical integrity of solder joints. J Mater Sci Mater Electron. 2013;24(9):3149.CrossRef Sona M, Prabhu KN. Review on microstructure evolution in Sn–Ag–Cu solders and its effect on mechanical integrity of solder joints. J Mater Sci Mater Electron. 2013;24(9):3149.CrossRef
[4]
go back to reference Kim KS, Huh SH, Suganuma K. Effects of intermetallic compounds on properties of Sn–Ag–Cu lead-free soldered joints. J Alloys Compd. 2003;352(1):226.CrossRef Kim KS, Huh SH, Suganuma K. Effects of intermetallic compounds on properties of Sn–Ag–Cu lead-free soldered joints. J Alloys Compd. 2003;352(1):226.CrossRef
[5]
go back to reference Zhang L, Tu KN. Structure and properties of lead-free solders bearing micro and nano particles. Mater Sci Eng R Rep. 2014;82(1):1. Zhang L, Tu KN. Structure and properties of lead-free solders bearing micro and nano particles. Mater Sci Eng R Rep. 2014;82(1):1.
[6]
go back to reference El-Daly AA, Hammad AE, Al-Ganainy GS, Ragab M. Properties enhancement of low Ag-content Sn–Ag–Cu lead-free solders containing small amount of Zn. J Alloys Compd. 2014;614(1):20.CrossRef El-Daly AA, Hammad AE, Al-Ganainy GS, Ragab M. Properties enhancement of low Ag-content Sn–Ag–Cu lead-free solders containing small amount of Zn. J Alloys Compd. 2014;614(1):20.CrossRef
[7]
go back to reference Chen KM, Wu JD, Chiang KN. Effects of pre-bump probing and bumping processes on eutectic solder bump electromigration. Microelectron Reliab. 2006;46(12):2104.CrossRef Chen KM, Wu JD, Chiang KN. Effects of pre-bump probing and bumping processes on eutectic solder bump electromigration. Microelectron Reliab. 2006;46(12):2104.CrossRef
[8]
go back to reference Wu JD, Zheng PJ, Lee CW, Hung SC, Lee JJ. A study in flip-chip UBM/bump reliability with effects of SnPb solder composition. Microelectron Reliab. 2006;46(1):41.CrossRef Wu JD, Zheng PJ, Lee CW, Hung SC, Lee JJ. A study in flip-chip UBM/bump reliability with effects of SnPb solder composition. Microelectron Reliab. 2006;46(1):41.CrossRef
[9]
go back to reference Liu XS, Lu GQ. Effects of solder joint shape and height on thermal fatigue lifetime. Compon Packag Technol. 2003;26(2):455.CrossRef Liu XS, Lu GQ. Effects of solder joint shape and height on thermal fatigue lifetime. Compon Packag Technol. 2003;26(2):455.CrossRef
[10]
go back to reference Liu XS, Haque S, Lu GQ. Three-dimensional flip-chip on flex packaging for power electronics applications. Adv Packag. 2001;24(1):1.CrossRef Liu XS, Haque S, Lu GQ. Three-dimensional flip-chip on flex packaging for power electronics applications. Adv Packag. 2001;24(1):1.CrossRef
[11]
go back to reference Xu HB, Sun HB, Yang H, Chi LX, Chen J. Microstructure and properties of joint for stirring brazing of dissimilar Al/Mg alloy during heating processes. Rare Met. 2015;34(4):245.CrossRef Xu HB, Sun HB, Yang H, Chi LX, Chen J. Microstructure and properties of joint for stirring brazing of dissimilar Al/Mg alloy during heating processes. Rare Met. 2015;34(4):245.CrossRef
[12]
go back to reference Chiang KN, Yuan CA. An overview of solder bump shape prediction algorithms with validations. Adv Packag. 2001;24(2):158.CrossRef Chiang KN, Yuan CA. An overview of solder bump shape prediction algorithms with validations. Adv Packag. 2001;24(2):158.CrossRef
[13]
go back to reference Liu XS, Xu SY, Lu GQ, Dillard DA. Stacked solder bumping technology for improved solder joint reliability. Microelectron Reliab. 2001;41(12):1979.CrossRef Liu XS, Xu SY, Lu GQ, Dillard DA. Stacked solder bumping technology for improved solder joint reliability. Microelectron Reliab. 2001;41(12):1979.CrossRef
[14]
go back to reference Heinrich SM, Schaefer M, Schroeder SA, Lee PS. Prediction of solder joint geometries in array-type interconnects. J Electron Packag. 1996;118(3):114.CrossRef Heinrich SM, Schaefer M, Schroeder SA, Lee PS. Prediction of solder joint geometries in array-type interconnects. J Electron Packag. 1996;118(3):114.CrossRef
[15]
go back to reference Tian YH, Wang CQ. Shape prediction and reliability design of ball grid array solder joints. Key Eng Mater. 2007;353–358(1):2944.CrossRef Tian YH, Wang CQ. Shape prediction and reliability design of ball grid array solder joints. Key Eng Mater. 2007;353–358(1):2944.CrossRef
[16]
go back to reference Guo F, Choi S, Lucas JP, Subramanian KN. Effects of reflow of wettability, microstructure, and mechanical properties in Pb-free solders. J Electron Mater. 2000;29(10):1241.CrossRef Guo F, Choi S, Lucas JP, Subramanian KN. Effects of reflow of wettability, microstructure, and mechanical properties in Pb-free solders. J Electron Mater. 2000;29(10):1241.CrossRef
[17]
go back to reference Peng WQ, Monlevade E, Marques ME. Effect of thermal aging on the interfacial structure of SnAgCu solder joints on Cu. Microelectron Reliab. 2007;47(12):2161.CrossRef Peng WQ, Monlevade E, Marques ME. Effect of thermal aging on the interfacial structure of SnAgCu solder joints on Cu. Microelectron Reliab. 2007;47(12):2161.CrossRef
[18]
go back to reference Kuan WC, Liang SW, Chen C. Effect of bump size on current density and temperature distributions in flip-chip solder joints. Microelectron Reliab. 2009;49(5):544.CrossRef Kuan WC, Liang SW, Chen C. Effect of bump size on current density and temperature distributions in flip-chip solder joints. Microelectron Reliab. 2009;49(5):544.CrossRef
[19]
go back to reference Chen CM, Chen SW. Electromigration effects upon the low-temperature Sn/Ni interfacial reactions. J Mater Res. 2003;18(6):1293.CrossRef Chen CM, Chen SW. Electromigration effects upon the low-temperature Sn/Ni interfacial reactions. J Mater Res. 2003;18(6):1293.CrossRef
[20]
go back to reference Frear DR, Jang JW, Lin JK, Zhang C. Pb-free solders for flip-chip interconnects. JOM. 2001;53(6):28.CrossRef Frear DR, Jang JW, Lin JK, Zhang C. Pb-free solders for flip-chip interconnects. JOM. 2001;53(6):28.CrossRef
[21]
go back to reference Yu CY, Wang KJ, Duh JG. Interfacial reaction of Sn and Cu–xZn substrates after reflow and thermal aging. J Electron Mater. 2010;39(2):230.CrossRef Yu CY, Wang KJ, Duh JG. Interfacial reaction of Sn and Cu–xZn substrates after reflow and thermal aging. J Electron Mater. 2010;39(2):230.CrossRef
Metadata
Title
Aging resistance and mechanical properties of Sn3.0Ag0.5Cu solder bump joints with different bump shapes
Authors
Ping Chen
Xiu-Chen Zhao
Ying Liu
Hong Li
Yong Wang
Publication date
18-09-2015
Publisher
Nonferrous Metals Society of China
Published in
Rare Metals / Issue 1/2021
Print ISSN: 1001-0521
Electronic ISSN: 1867-7185
DOI
https://doi.org/10.1007/s12598-015-0612-4

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