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Journal of Electronic Testing
Published in: Journal of Electronic Testing 3/2011

01-06-2011

Analog Sinewave Signal Generators for Mixed-Signal Built-in Test Applications

Authors: Manuel J. Barragán, Diego Vázquez, Adoración Rueda

Published in: Journal of Electronic Testing | Issue 3/2011

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Abstract

This work presents a technique for the generation of analog sinusoidal signals with high spectral quality and reduced circuitry resources. Two integrated demonstrators are presented to show the feasibility of the approach. The proposed generation technique is based on a modified analog filter that provides a sinusoidal output as the response to a DC input. It has the attributes of digital programming and control, low area overhead, and low design effort, which make this approach very suitable as test stimulus generator for built-in test applications. The demonstrators—a continuous-time generator and a discrete-time one—have been integrated in a standard 0.35 μm CMOS technology. Simulation results and experimental measurements in the lab are provided, and the obtained performance is compared to current state-of-the-art on-chip generation strategies.
previous article A Level-Crossing Approach for the Analysis of RF Modulated Signals Using Only Digital Test Resources
next article Pseudorandom Test of Nonlinear Analog and Mixed-Signal Circuits Based on a Volterra Series Model

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Metadata
Title
Analog Sinewave Signal Generators for Mixed-Signal Built-in Test Applications
Authors
Manuel J. Barragán
Diego Vázquez
Adoración Rueda
Publication date
01-06-2011
Publisher
Springer US
Published in
Journal of Electronic Testing / Issue 3/2011
Print ISSN: 0923-8174
Electronic ISSN: 1573-0727
DOI
https://doi.org/10.1007/s10836-010-5192-5

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