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Published in: Journal of Materials Science: Materials in Electronics 16/2022

25-04-2022

Cu–Cu bonding using bimodal submicron–nano Cu paste and its application in die attachment for power device

Authors: Yu-bo Xiao, Yue Gao, Zhi-Quan Liu, Rong Sun, Yang Liu

Published in: Journal of Materials Science: Materials in Electronics | Issue 16/2022

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Abstract

The bimodal submicron–nano Cu paste was developed for the application in die attachment for power device, and robust Cu sinter joints could be realized at a low pressure of 0.4 MPa in N2 atmosphere. The ratio of submicron-Cu and nano-Cu particles had a great influence on the bonding performance of Cu paste. The optimized content ratio of submicron-Cu and nano-Cu particles was 1:1, with which the high shear strength of 40 MPa could be achieved at 250 °C, and an ultra-high shear strength of 60.4 MPa could be reached at 300 °C. At the same time, the porosity of the sintered body could be reduced to 11.3%, while the resistivity could be reduced to 11.2 μΩ cm. Compared with the Cu sinter joint of pure nano-Cu paste at 300 °C, the shear strength of submicron:nano = 1:1 Cu paste was increased by 27.3 MPa, the porosity was reduced to 33.7%, and the resistivity was reduced to 16.7%. And the reasons for this phenomenon are explained from the packing density of the Cu particles, the size, and proportion of the Cu particles. The presented bimodal Cu paste possessed high bonding performance which had enormous potential in industrial production.

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Literature
1.
2.
go back to reference Z. Liu, J. Cai, Q. Wang, Z. Wang, L. Liu, G. Zou, J. Alloys Compd. 767, 575 (2018)CrossRef Z. Liu, J. Cai, Q. Wang, Z. Wang, L. Liu, G. Zou, J. Alloys Compd. 767, 575 (2018)CrossRef
3.
go back to reference A.Q. Huang, in 62nd Annual IEEE International Electron Devices Meeting (IEDM), San Francisco, CA, 2016 Dec 03–07; (San Francisco, CA, 2016). A.Q. Huang, in 62nd Annual IEEE International Electron Devices Meeting (IEDM), San Francisco, CA, 2016 Dec 03–07; (San Francisco, CA, 2016).
4.
go back to reference F. Roccaforte, P. Fiorenza, G. Greco, R. LoNigro, F. Giannazzo, F. Iucolano, M. Saggio, Microelectron. Eng. 187, 66 (2018)CrossRef F. Roccaforte, P. Fiorenza, G. Greco, R. LoNigro, F. Giannazzo, F. Iucolano, M. Saggio, Microelectron. Eng. 187, 66 (2018)CrossRef
7.
go back to reference H. Fang, C. Wang, S. Zhou, Q. Kang, T. Wang, D. Yang, Y. Tian, J. Mater. Sci. 31(8), 6497 (2020) H. Fang, C. Wang, S. Zhou, Q. Kang, T. Wang, D. Yang, Y. Tian, J. Mater. Sci. 31(8), 6497 (2020)
8.
go back to reference F. Yang, B. Hu, Y. Peng, C. Hang, H. Chen, C. Lee, J. Wei, M. Li, J. Mater. Sci. 30(6), 5526 (2019) F. Yang, B. Hu, Y. Peng, C. Hang, H. Chen, C. Lee, J. Wei, M. Li, J. Mater. Sci. 30(6), 5526 (2019)
9.
go back to reference F. Yu, R.W. Johnson, M.C. Hamilton, IEEE Trans. Comp. Packag. Manuf. Technol. 5(9), 1258 (2015)CrossRef F. Yu, R.W. Johnson, M.C. Hamilton, IEEE Trans. Comp. Packag. Manuf. Technol. 5(9), 1258 (2015)CrossRef
10.
go back to reference Z. Zhang, C. Chen, Y. Yang, H. Zhang, D. Kim, T. Sugahara, S. Nagao, K. Suganuma, J. Alloys Compd. 780, 435 (2019)CrossRef Z. Zhang, C. Chen, Y. Yang, H. Zhang, D. Kim, T. Sugahara, S. Nagao, K. Suganuma, J. Alloys Compd. 780, 435 (2019)CrossRef
11.
go back to reference Y. Gao, Y.B. Xiao, J. Mater. Sci. 33, 3576 (2022) Y. Gao, Y.B. Xiao, J. Mater. Sci. 33, 3576 (2022)
12.
go back to reference Y. Kobayashi, T. Shirochi, Y. Yasuda, T. Morita, Int. J. Adhes. Adhes. 33, 50 (2012)CrossRef Y. Kobayashi, T. Shirochi, Y. Yasuda, T. Morita, Int. J. Adhes. Adhes. 33, 50 (2012)CrossRef
13.
go back to reference Y. Kobayashi, Y. Abe, T. Maeda, Y. Yasuda, T. Morita, J. Mater. Res. Technol. 3(2), 114 (2014)CrossRef Y. Kobayashi, Y. Abe, T. Maeda, Y. Yasuda, T. Morita, J. Mater. Res. Technol. 3(2), 114 (2014)CrossRef
14.
go back to reference D. Yamagiwa, T. Matsuda, H. Furusawa, K. Sato, H. Tatsumi, T. Sano, Y. Kashiba, A. Hirose, J. Mater. Sci. 32(14), 19031 (2021) D. Yamagiwa, T. Matsuda, H. Furusawa, K. Sato, H. Tatsumi, T. Sano, Y. Kashiba, A. Hirose, J. Mater. Sci. 32(14), 19031 (2021)
15.
go back to reference Y. Zuo, S. Carter-Searjeant, M. Green, L. Mills, S. H. Mannan, Materials Letters. 276 (2020) Y. Zuo, S. Carter-Searjeant, M. Green, L. Mills, S. H. Mannan, Materials Letters. 276 (2020)
17.
go back to reference J. Liu, H. Chen, H. Ji, M. Li, ACS Appl. Mater. Interfaces. 8(48), 33289 (2016)CrossRef J. Liu, H. Chen, H. Ji, M. Li, ACS Appl. Mater. Interfaces. 8(48), 33289 (2016)CrossRef
18.
go back to reference T. Yamakawa, T. Takemoto, M. Shimoda, H. Nishikawa, K. Shiokawa, N. Terada, J. Electron. Mater. 42(6), 1260 (2013)CrossRef T. Yamakawa, T. Takemoto, M. Shimoda, H. Nishikawa, K. Shiokawa, N. Terada, J. Electron. Mater. 42(6), 1260 (2013)CrossRef
20.
go back to reference J.H. Prosser, T. Brugarolas, S. Lee, A.J. Nolte, D. Lee, Nano Lett. 12(10), 5287 (2012)CrossRef J.H. Prosser, T. Brugarolas, S. Lee, A.J. Nolte, D. Lee, Nano Lett. 12(10), 5287 (2012)CrossRef
21.
go back to reference R.Y. Yang, R.P. Zou, A.B. Yu, S.K. Choi, J. Colloid Interface Sci. 299(2), 719 (2006)CrossRef R.Y. Yang, R.P. Zou, A.B. Yu, S.K. Choi, J. Colloid Interface Sci. 299(2), 719 (2006)CrossRef
22.
go back to reference A. Pajor-Świerzy, Y. Farraj, A. Kamyshny, S.J.C. Magdassi, S.A. Physicochemical, E. Aspects, Air stable copper-silver core-shell submicron particles: Synthesis and conductive ink formulation. Colloids Surf. A 521, 272 (2017)CrossRef A. Pajor-Świerzy, Y. Farraj, A. Kamyshny, S.J.C. Magdassi, S.A. Physicochemical, E. Aspects, Air stable copper-silver core-shell submicron particles: Synthesis and conductive ink formulation. Colloids Surf. A 521, 272 (2017)CrossRef
23.
go back to reference Y. Peng, Y. Mou, J. Liu, M. Chen, J. Mater. Sci. 31(11), 8456 (2020) Y. Peng, Y. Mou, J. Liu, M. Chen, J. Mater. Sci. 31(11), 8456 (2020)
24.
25.
go back to reference J. Jiu, H. Zhang, S. Koga, S. Nagao, Y. Izumi, K. Suganuma, J. Mater. Sci.-Mater. Electron. 26(9), 7183 (2015)CrossRef J. Jiu, H. Zhang, S. Koga, S. Nagao, Y. Izumi, K. Suganuma, J. Mater. Sci.-Mater. Electron. 26(9), 7183 (2015)CrossRef
26.
29.
go back to reference R.M. German, M. Bulger, Int. J. Powder Metall. 28(3), 301 (1992) R.M. German, M. Bulger, Int. J. Powder Metall. 28(3), 301 (1992)
31.
go back to reference Y. Zuo, J. Shen, J. Xie, L. Xiang, J. Mater. Process. Technol. 257, 250 (2018)CrossRef Y. Zuo, J. Shen, J. Xie, L. Xiang, J. Mater. Process. Technol. 257, 250 (2018)CrossRef
32.
go back to reference Y. Morisada, T. Nagaoka, M. Fukusumi, Y. Kashiwagi, M. Yamamoto, M. Nakamoto, H. Kakiuchi, Y. Yoshida, J. Electron. Mater. 40(12), 2398 (2011)CrossRef Y. Morisada, T. Nagaoka, M. Fukusumi, Y. Kashiwagi, M. Yamamoto, M. Nakamoto, H. Kakiuchi, Y. Yoshida, J. Electron. Mater. 40(12), 2398 (2011)CrossRef
34.
go back to reference J. Kaehler, N. Heuck, A. Wagner, A. Stranz, E. Peiner, A. Waag, IEEE Trans. Comp. Packag. Manuf. Technol. 2(10), 1587 (2012)CrossRef J. Kaehler, N. Heuck, A. Wagner, A. Stranz, E. Peiner, A. Waag, IEEE Trans. Comp. Packag. Manuf. Technol. 2(10), 1587 (2012)CrossRef
Metadata
Title
Cu–Cu bonding using bimodal submicron–nano Cu paste and its application in die attachment for power device
Authors
Yu-bo Xiao
Yue Gao
Zhi-Quan Liu
Rong Sun
Yang Liu
Publication date
25-04-2022
Publisher
Springer US
Published in
Journal of Materials Science: Materials in Electronics / Issue 16/2022
Print ISSN: 0957-4522
Electronic ISSN: 1573-482X
DOI
https://doi.org/10.1007/s10854-022-08210-z

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