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Published in: Journal of Materials Science: Materials in Electronics 4/2008

01-04-2008

Dielectric and piezoelectric characterization of PSZT–BT ceramics for capacitor applications

Authors: Ramam Koduri, Jose Rodrigo Anfossi Orellana

Published in: Journal of Materials Science: Materials in Electronics | Issue 4/2008

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Abstract

The ceramic compositions (1 − x)Pb0.9875Sr0.0125(Zr0.53Ti0.47)O3 –xBaTiO3 where x = 0.2, 0.4, 0.6 and 0.8, fabricated through solid state reaction method were investigated for phase formation, microstructure, density, dielectric and piezoelectric properties. The X-ray diffraction patterns indicated that introduction of BaTiO3 in isovalent donor Sr modified PZT lattice, diminished the tetragonality. All the specimens were homogenous in nature due to the coarse grains of BaTiO3, which had undergone inter-granular growth and were homogeneously distributed within the PSZT–BT lattice. Introduction of BaTiO3 in PSZT perovskite lattice resulted in enhanced grain growth till x = 0.6 (2.03 μm). Dielectric properties (εRT, Tanδ and T c) were influenced by both BaTiO3 and Sr. The maximum εRT = 1588 and εTc = 10478 were found in 0.2PSZT–0.8BT ceramic system. The optimum dielectric permittivity at room temperature with a low Curie transition temperature was found in 0.2PSZT–0.8BT composition. Piezoelectric properties are very sensitive to isovalent substitutions, where isovalent donor Sr modification and BT concentrations in PZT, affected the piezoelectric properties (k p and d 33) in the ceramic system. Thus, the series PSZT–BT compositions could be ideal candidates for capacitors and suitable sensor applications.

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Metadata
Title
Dielectric and piezoelectric characterization of PSZT–BT ceramics for capacitor applications
Authors
Ramam Koduri
Jose Rodrigo Anfossi Orellana
Publication date
01-04-2008
Publisher
Springer US
Published in
Journal of Materials Science: Materials in Electronics / Issue 4/2008
Print ISSN: 0957-4522
Electronic ISSN: 1573-482X
DOI
https://doi.org/10.1007/s10854-007-9346-x

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