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Journal of Electronic Testing
Published in: Journal of Electronic Testing 2/2015

01-04-2015

Editorial

Author: Vishwani D. Agrawal

Published in: Journal of Electronic Testing | Issue 2/2015

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Excerpt

This issue contains six papers and two Letters. The topics covered are mixed-signal test, microprocessor reliability, system verification, and soft errors. The first paper is derived from the program of the Asian Test Symposium (ATS) of 2013 and the next three papers were first presented at the IEEE Latin American Test Workshop (LATW) of 2014. I would like to thank the two Guest Editors Jiun-Lang Huang (ATS) and Leticia M. B. Poehls (LATW). …
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Metadata
Title
Editorial
Author
Vishwani D. Agrawal
Publication date
01-04-2015
Publisher
Springer US
Published in
Journal of Electronic Testing / Issue 2/2015
Print ISSN: 0923-8174
Electronic ISSN: 1573-0727
DOI
https://doi.org/10.1007/s10836-015-5522-8

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Application-Based Analysis of Register File Criticality for Reliability Assessment in Embedded Microprocessors

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A Determinate Radiation Hardened Technique for Safety-Critical CMOS Designs

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Formal Quantification of the Register Vulnerabilities to Soft Error in RTL Control Paths

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Analog Circuits Soft Fault Diagnosis Using Rényi’s Entropy