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Published in: Microsystem Technologies 4/2018

19-02-2018 | Technical Paper

Effect of size on the dynamic behaviors of atomic force microscopes

Authors: Mehdi Molavian Jazi, Mostafa Ghayour, Saeed Ziaei-Rad, Ehsan Maani Miandoab

Published in: Microsystem Technologies | Issue 4/2018

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Abstract

Accurate mathematical modeling and simulation of cantilever dynamics are crucial to design and fabrication of the atomic force microscope (AFM). Thickness of AFM cantilevers is in order of few microns or sub-microns and producers trend to make it even smaller because of more resolution and sensitivity. By reducing the cantilever thickness, size effect may be appeared which changes the AFM dynamics. In this paper, effect of size on dynamic behavior of AFM is investigated based on the modified couple stress theory. The AFM is modeled as an Euler–Bernoulli micro-cantilever and the Galerkin projection method is applied to derive the lumped model. Investigation of free vibration amplitude shows the necessity of considering the size effect. Accuracy of solution is verified by comparing the results with two degree-of-freedom model and analogue equations method. Furthermore, stability analysis and frequency response of AFM based on classic and non-classic theories are investigated and the obtained results are compared with each other. Findings of the present study show that considering size effect have significant effect on reliable estimation of the AFM dynamic.

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Literature
go back to reference Ashhab M, Salapaka MV, Dahleh M (1999) Melnikov-based dynamical analysis of microcantilevers in scanning probe microscopy. Nonlinear Dyn 20:197–220MathSciNetCrossRefMATH Ashhab M, Salapaka MV, Dahleh M (1999) Melnikov-based dynamical analysis of microcantilevers in scanning probe microscopy. Nonlinear Dyn 20:197–220MathSciNetCrossRefMATH
go back to reference Binnig G, Quate CF (1986) Atomic force microscope. Phys Rev Lett 56:930–934CrossRef Binnig G, Quate CF (1986) Atomic force microscope. Phys Rev Lett 56:930–934CrossRef
go back to reference Fleck NA, Muller GM, Ashby MF, Hutchinson JW (1994) Strain gradient plasticity: theory and experiment. Acta Met 42:475–487CrossRef Fleck NA, Muller GM, Ashby MF, Hutchinson JW (1994) Strain gradient plasticity: theory and experiment. Acta Met 42:475–487CrossRef
go back to reference Katsikadelis J, Tsiatas G (2004) Non-linear dynamic analysis of beams with variable stiffness. J Sound Vib 270:847–863CrossRef Katsikadelis J, Tsiatas G (2004) Non-linear dynamic analysis of beams with variable stiffness. J Sound Vib 270:847–863CrossRef
go back to reference Lin S, Liauh C, Lee S et al (2014) Frequency shifts and analytical solutions of an AFM curved beam. Measurement 47:296–305CrossRef Lin S, Liauh C, Lee S et al (2014) Frequency shifts and analytical solutions of an AFM curved beam. Measurement 47:296–305CrossRef
go back to reference Martin Y, Williams CC, Wickramasinghe HK (1987) Atomic force microscope-force mapping and profiling on a sub 100-Å scale. J Appl Phys 61:4723–4729CrossRef Martin Y, Williams CC, Wickramasinghe HK (1987) Atomic force microscope-force mapping and profiling on a sub 100-Å scale. J Appl Phys 61:4723–4729CrossRef
go back to reference Meyer E (1992) Atomic force microscopy. Surf Sci 41:3–49 Meyer E (1992) Atomic force microscopy. Surf Sci 41:3–49
go back to reference Müller DJ, Dufrêne YF (2008) Atomic force microscopy as a multifunctional molecular toolbox in nanobiotechnology. Nat Nanotechnol 3:261–269CrossRef Müller DJ, Dufrêne YF (2008) Atomic force microscopy as a multifunctional molecular toolbox in nanobiotechnology. Nat Nanotechnol 3:261–269CrossRef
go back to reference Namazu T, Isono Y, Tanaka T (2000) Evaluation of size effect on mechanical properties of single crystal silicon by nanoscale bending test using AFM. J Microelectromech Syst 9:450–459CrossRef Namazu T, Isono Y, Tanaka T (2000) Evaluation of size effect on mechanical properties of single crystal silicon by nanoscale bending test using AFM. J Microelectromech Syst 9:450–459CrossRef
go back to reference Salgar M (2012) Modeling of AFM microcantilevers operating in tapping mode. Int J Appl Eng Res 7:7–10 Salgar M (2012) Modeling of AFM microcantilevers operating in tapping mode. Int J Appl Eng Res 7:7–10
go back to reference Sami S, Damircheli M, Korayam MH (2014) Frequency response of AFM nano robot in liquid by considering the effect of cantilever dimension and environmental parameters. Int J Adv Des Manuf Technol 7:55–66 Sami S, Damircheli M, Korayam MH (2014) Frequency response of AFM nano robot in liquid by considering the effect of cantilever dimension and environmental parameters. Int J Adv Des Manuf Technol 7:55–66
go back to reference Stolken JS, Evans AG (1998) A microbend test method for measuring the plasticity length scale. Acta Mater 46:5109–5115CrossRef Stolken JS, Evans AG (1998) A microbend test method for measuring the plasticity length scale. Acta Mater 46:5109–5115CrossRef
go back to reference Zhong Q, Inniss D, Kjoller K, Elings VB (1983) Fractured polymer/silica fiber surface studied by tapping mode atomic force microscopy. Surf Sci 290(1–2):688–692 Zhong Q, Inniss D, Kjoller K, Elings VB (1983) Fractured polymer/silica fiber surface studied by tapping mode atomic force microscopy. Surf Sci 290(1–2):688–692
Metadata
Title
Effect of size on the dynamic behaviors of atomic force microscopes
Authors
Mehdi Molavian Jazi
Mostafa Ghayour
Saeed Ziaei-Rad
Ehsan Maani Miandoab
Publication date
19-02-2018
Publisher
Springer Berlin Heidelberg
Published in
Microsystem Technologies / Issue 4/2018
Print ISSN: 0946-7076
Electronic ISSN: 1432-1858
DOI
https://doi.org/10.1007/s00542-017-3698-9

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