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Published in: Journal of Materials Science: Materials in Electronics 5/2013

01-05-2013 | Review

Effects of Ag particles content on properties of Sn0.7Cu solder

Author: Li Yang

Published in: Journal of Materials Science: Materials in Electronics | Issue 5/2013

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Abstract

To improve properties of Sn0.7Cu solder, method of particles reinforced was employed. Effects of Ag particle contents (1, 3, 5, 7.5, and 10 vol.%) on spreadability, microstructure, shear strength and creep rupture life of Sn0.7Cu solders have been studied. The experimental results indicate that intermetallic compound (IMC) grows, Shear strength is increased and grains are fined with the increasing of Ag particles. When content of Ag particles is more than 5 vol.%, growth rate of IMC is increased significantly. When the content of Ag is 5 vol.%, the composite solder presents best spreadability and excellent creep rupture property which have maximum spreading area, minimum wetting angle and longest creep rupture life (about 22 times as long as that of Sn0.7Cu solder).

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Literature
1.
go back to reference M. Abtew, G. Selvaduray, Lead-free solders in microelectronics. J. Mater. Sci. Eng. R 27, 95–141 (2000)CrossRef M. Abtew, G. Selvaduray, Lead-free solders in microelectronics. J. Mater. Sci. Eng. R 27, 95–141 (2000)CrossRef
2.
go back to reference S. Bergman, K.N. Subramanian, Critical studies to improve service reliability of Sn–Ag–Cu solder joints by thermal treatments. J. Mater. Sci. Mater. Electron. 23, 1442–1448 (2012)CrossRef S. Bergman, K.N. Subramanian, Critical studies to improve service reliability of Sn–Ag–Cu solder joints by thermal treatments. J. Mater. Sci. Mater. Electron. 23, 1442–1448 (2012)CrossRef
3.
go back to reference C.Y. Yu, J.G. Duh, Growth mechanisms of interfacial intermetallic compounds in Sn/Cu–Zn solder joints during aging. J. Mater. Sci. 47, 6467–6474 (2012)CrossRef C.Y. Yu, J.G. Duh, Growth mechanisms of interfacial intermetallic compounds in Sn/Cu–Zn solder joints during aging. J. Mater. Sci. 47, 6467–6474 (2012)CrossRef
4.
go back to reference L. Ma, G. Xu, J. Sun, F. Guo, X. Wang, Effects of Co additions on electromigration behaviors in Sn–3.0Ag–0.5Cu-based solder joint. J. Mater. Sci. 46, 4896–4905 (2012)CrossRef L. Ma, G. Xu, J. Sun, F. Guo, X. Wang, Effects of Co additions on electromigration behaviors in Sn–3.0Ag–0.5Cu-based solder joint. J. Mater. Sci. 46, 4896–4905 (2012)CrossRef
5.
go back to reference P. Xue, S. Xue, Y. Shen, H. Zhu, L. Gao, Study on properties of Sn–9Zn–Ga solder bearing Nd. J. Mater. Sci. Mater. Electron. 23, 1272–1278 (2012)CrossRef P. Xue, S. Xue, Y. Shen, H. Zhu, L. Gao, Study on properties of Sn–9Zn–Ga solder bearing Nd. J. Mater. Sci. Mater. Electron. 23, 1272–1278 (2012)CrossRef
6.
go back to reference J.H. Ke, T.L. Yang, Y.S. Lai, C.R. Kao, Analysis and experimental verification of the competing degradation mechanisms for solder joints under electron current stressing. Acta Mater. 59, 2461–2468 (2011)CrossRef J.H. Ke, T.L. Yang, Y.S. Lai, C.R. Kao, Analysis and experimental verification of the competing degradation mechanisms for solder joints under electron current stressing. Acta Mater. 59, 2461–2468 (2011)CrossRef
7.
go back to reference T. Ventura, S. Terzi, M. Rappaz, A.K. Dahle, Effects of solidification kinetics on microstructure formation in binary Sn–Cu solder alloys. Acta Mater. 59, 1651–1658 (2011)CrossRef T. Ventura, S. Terzi, M. Rappaz, A.K. Dahle, Effects of solidification kinetics on microstructure formation in binary Sn–Cu solder alloys. Acta Mater. 59, 1651–1658 (2011)CrossRef
8.
go back to reference J.K. Han, D. Choi, M. Fujiyoshi, N. Chiwata, K.N. Tu, Current density redistribution from no current crowding to current crowding in Pb-free solder joints with an extremely thick Cu layer. Acta Mater. 60, 102–111 (2012)CrossRef J.K. Han, D. Choi, M. Fujiyoshi, N. Chiwata, K.N. Tu, Current density redistribution from no current crowding to current crowding in Pb-free solder joints with an extremely thick Cu layer. Acta Mater. 60, 102–111 (2012)CrossRef
9.
go back to reference A.K. Gain, T. Fouzder, Y.C. Chan, A. Sharif, N.B. Wong, W.K.C. Yung, The influence of addition of Al nano-particles on the microstructure and shear strength of eutectic Sn–Ag–Cu solder on Au/Ni metallized Cu pads. J. Alloys Compd. 506, 216–223 (2010)CrossRef A.K. Gain, T. Fouzder, Y.C. Chan, A. Sharif, N.B. Wong, W.K.C. Yung, The influence of addition of Al nano-particles on the microstructure and shear strength of eutectic Sn–Ag–Cu solder on Au/Ni metallized Cu pads. J. Alloys Compd. 506, 216–223 (2010)CrossRef
10.
go back to reference B.S.S.C. Rao, K.M. Kumar, V. Kripesh, K.Y. Zeng, Tensile deformation behavior of nano-sized Mo particles reinforced SnAgCu solders. Mater. Sci. Eng. A 528, 4166–4172 (2011)CrossRef B.S.S.C. Rao, K.M. Kumar, V. Kripesh, K.Y. Zeng, Tensile deformation behavior of nano-sized Mo particles reinforced SnAgCu solders. Mater. Sci. Eng. A 528, 4166–4172 (2011)CrossRef
11.
go back to reference J. Shen, C.F. Peng, M.L. Zhao, C.P. Wu, Microstructural evolutions of the Ag nano-particle reinforced SnBiCu-xAg/Cu solder joints during liquid aging. J. Mater. Sci. Mater. Electron. 23, 1409–1414 (2012)CrossRef J. Shen, C.F. Peng, M.L. Zhao, C.P. Wu, Microstructural evolutions of the Ag nano-particle reinforced SnBiCu-xAg/Cu solder joints during liquid aging. J. Mater. Sci. Mater. Electron. 23, 1409–1414 (2012)CrossRef
12.
go back to reference T.H. Chuang, M.W. Wu, S.Y. Chang, S.F. Ping, L.C. Tsao, Strengthening mechanism of nano-Al2O3 particles reinforced Sn3.5Ag0.5Cu lead-free solder. J. Mater. Sci. Mater. Electron. 22, 1021–1027 (2011)CrossRef T.H. Chuang, M.W. Wu, S.Y. Chang, S.F. Ping, L.C. Tsao, Strengthening mechanism of nano-Al2O3 particles reinforced Sn3.5Ag0.5Cu lead-free solder. J. Mater. Sci. Mater. Electron. 22, 1021–1027 (2011)CrossRef
13.
go back to reference R.H. Zhang, G.C. Xu, X.T. Wang, F. Guo, A. Lee, K.N. Subramanian, Electromigration in Sn–Bi modified with polyhedral oligomeric silsesquioxane. J. Electron. Mater. 39, 2513–2521 (2010)CrossRef R.H. Zhang, G.C. Xu, X.T. Wang, F. Guo, A. Lee, K.N. Subramanian, Electromigration in Sn–Bi modified with polyhedral oligomeric silsesquioxane. J. Electron. Mater. 39, 2513–2521 (2010)CrossRef
14.
go back to reference F. Guo, G.C. Xu, H.W. He, Electromigration behaviors in Sb particle-reinforced composite eutectic SnAgCu solder joints. J. Mater. Sci. 44, 5595–5601 (2009)CrossRef F. Guo, G.C. Xu, H.W. He, Electromigration behaviors in Sb particle-reinforced composite eutectic SnAgCu solder joints. J. Mater. Sci. 44, 5595–5601 (2009)CrossRef
15.
go back to reference Y.F. Yan, H.X. Yan, F.X. Chen, K.K. Zhang, J.H. Zhu, Influence of stress on the creep behavior of Cu particle enhancement SnPb based composite solder joints. Rare Met. 26, 51–55 (2007)CrossRef Y.F. Yan, H.X. Yan, F.X. Chen, K.K. Zhang, J.H. Zhu, Influence of stress on the creep behavior of Cu particle enhancement SnPb based composite solder joints. Rare Met. 26, 51–55 (2007)CrossRef
16.
go back to reference Y.F. Yan, J.H. Zhu, F.X. Chen, J.G. He, D.X. Yang, Creep behavior on Ag particle reinforced SnCu based composite solder joints. Trans. Nonferrous. Met. Soc. Ch. 16, 1116–1200 (2006)CrossRef Y.F. Yan, J.H. Zhu, F.X. Chen, J.G. He, D.X. Yang, Creep behavior on Ag particle reinforced SnCu based composite solder joints. Trans. Nonferrous. Met. Soc. Ch. 16, 1116–1200 (2006)CrossRef
Metadata
Title
Effects of Ag particles content on properties of Sn0.7Cu solder
Author
Li Yang
Publication date
01-05-2013
Publisher
Springer US
Published in
Journal of Materials Science: Materials in Electronics / Issue 5/2013
Print ISSN: 0957-4522
Electronic ISSN: 1573-482X
DOI
https://doi.org/10.1007/s10854-012-0946-8

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