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Published in: Microsystem Technologies 8/2013

01-08-2013 | Technical Paper

Effects of package on the performance of MEMS piezoresistive accelerometers

Authors: Ping Li, Shiqiao Gao, Haipeng Liu, Jun Liu, Yunbo Shi

Published in: Microsystem Technologies | Issue 8/2013

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Abstract

Package is one of the key technologies for MEMS accelerometers. This paper investigated the influence of package on performances of custom-designed MEMS piezoresistive accelerometer. Based on the designed package process, the effect of die adhesive and potting materials on the sensor sensitivity and residual stress were studied by theory analysis and experimental test. The results showed that: with more quantity of die adhesive when the thickness was fixed, the sensitivity of MEMS piezoresistive accelerometer was much smaller; in addition, with thicker die adhesive, the accelerometer had much bigger sensitivity and much smaller residual stress increment after the die attach process. Meanwhile, the sensitivity was proportional to the density of potting material, and it varied with the elastic modulus.

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Literature
go back to reference Atwell AR, Okojie RS, Kornegay KT (2003) Simulation, fabrication and testing of bulk micromachined 6H-SiC high-g piezoresistive accelerometers. Sens Actuators A 104:11–18CrossRef Atwell AR, Okojie RS, Kornegay KT (2003) Simulation, fabrication and testing of bulk micromachined 6H-SiC high-g piezoresistive accelerometers. Sens Actuators A 104:11–18CrossRef
go back to reference Campabadal F, Llu′ıs Carreras J, Cabruja E (2006) Flip-chip packaging of piezoresistive pressure sensors. Sens Actuators A 132:415–419CrossRef Campabadal F, Llu′ıs Carreras J, Cabruja E (2006) Flip-chip packaging of piezoresistive pressure sensors. Sens Actuators A 132:415–419CrossRef
go back to reference Chen QQ, Xuan FZ, Tu ST (2009) Modeling of creep deformation and its effect on stress distribution in multilayer systems under residual stress and external bending. Thin Solid Films 517:2924–2929CrossRef Chen QQ, Xuan FZ, Tu ST (2009) Modeling of creep deformation and its effect on stress distribution in multilayer systems under residual stress and external bending. Thin Solid Films 517:2924–2929CrossRef
go back to reference Davies BR, Baker CC, Montague S (1997) High-G MEMS integrated accelerometer. Pro SPIE 3046:52–62CrossRef Davies BR, Baker CC, Montague S (1997) High-G MEMS integrated accelerometer. Pro SPIE 3046:52–62CrossRef
go back to reference Ghisi A, Fachin F, Mariani S (2009) Multi-scale analysis of polysilicon MEMS sensors subject to accidental drops: effect of packaging. Microelectron Reliab 49:340–349CrossRef Ghisi A, Fachin F, Mariani S (2009) Multi-scale analysis of polysilicon MEMS sensors subject to accidental drops: effect of packaging. Microelectron Reliab 49:340–349CrossRef
go back to reference Gradolpha C, Friedberger A, Mllera G (2009) Impact of high-g and high vibration environments on piezoresistive pressure sensor performance. Sens Actuators A 150:69–77CrossRef Gradolpha C, Friedberger A, Mllera G (2009) Impact of high-g and high vibration environments on piezoresistive pressure sensor performance. Sens Actuators A 150:69–77CrossRef
go back to reference Guo T, Li P, Xu Y (2011) Study on the package of MEMS high-g acceleration sensor. Adv Mater Res 211–212(pt.2):973–977 Guo T, Li P, Xu Y (2011) Study on the package of MEMS high-g acceleration sensor. Adv Mater Res 211–212(pt.2):973–977
go back to reference He X, Oyadiji SO (2001) Influence of adhesive characteristics on the transverse free vibration of single lap-jointed cantilever beams. J Mater Process Technol 119:366–373CrossRef He X, Oyadiji SO (2001) Influence of adhesive characteristics on the transverse free vibration of single lap-jointed cantilever beams. J Mater Process Technol 119:366–373CrossRef
go back to reference Hsueh CH (2002) Thermal stresses in elastic multilayer systems. Thin Solid Films 418:182–188CrossRef Hsueh CH (2002) Thermal stresses in elastic multilayer systems. Thin Solid Films 418:182–188CrossRef
go back to reference Huang WD, Cai X, Xu B (2003) Packaging effects on the performances of MEMS for high-G accelerometer with double cantilevers. Sens Actuators A 1(102):268–278 Huang WD, Cai X, Xu B (2003) Packaging effects on the performances of MEMS for high-G accelerometer with double cantilevers. Sens Actuators A 1(102):268–278
go back to reference Huang S, Li X, Song Z et al (2005) A high-performance micromachined piezoresistive accelerometer with axially stressed tiny beams. J Micromech Microeng 15(5):993CrossRef Huang S, Li X, Song Z et al (2005) A high-performance micromachined piezoresistive accelerometer with axially stressed tiny beams. J Micromech Microeng 15(5):993CrossRef
go back to reference Jiang YQ, Du MH, Luo L (2004) Effect of potting on the packaging of high-g MEMS accelerometer. J Mech Strength 26:149–153 Jiang YQ, Du MH, Luo L (2004) Effect of potting on the packaging of high-g MEMS accelerometer. J Mech Strength 26:149–153
go back to reference Kal S, Das S, Maurya DK (2006) CMOS compatible bulk micromachined silicon piezoresistive accelerometer with low off-axis sensitivity. Microelectron J 1(37):22–30CrossRef Kal S, Das S, Maurya DK (2006) CMOS compatible bulk micromachined silicon piezoresistive accelerometer with low off-axis sensitivity. Microelectron J 1(37):22–30CrossRef
go back to reference Kniffin ML (1996) Packaging for Silicon Micromachined Accelerometer. Int J Microcircuits Electron Packag 19(1):75–86 Kniffin ML (1996) Packaging for Silicon Micromachined Accelerometer. Int J Microcircuits Electron Packag 19(1):75–86
go back to reference Kuells R (2012) Novel piezoresistive high-g accelerometer geometry with very high sensitivity-bandwidth product. Sens Actuators A 182:41–48CrossRef Kuells R (2012) Novel piezoresistive high-g accelerometer geometry with very high sensitivity-bandwidth product. Sens Actuators A 182:41–48CrossRef
go back to reference Kuells R, Nau S, Salk M (2012) Novel piezoresistive high-g accelerometer geometry with very high sensitivity-bandwidth product. Sens Actuators A: Phys 182:42–49CrossRef Kuells R, Nau S, Salk M (2012) Novel piezoresistive high-g accelerometer geometry with very high sensitivity-bandwidth product. Sens Actuators A: Phys 182:42–49CrossRef
go back to reference Lawes RA (2007) Manufacturing costs for Microsystems/MEMS using high aspect ratio micro-fabrication techniques. Microsyst Technol 13:85–95CrossRef Lawes RA (2007) Manufacturing costs for Microsystems/MEMS using high aspect ratio micro-fabrication techniques. Microsyst Technol 13:85–95CrossRef
go back to reference Li Q, Goosen JFL, Beek JTM (2008) Failure analysis of a thin-film nitride MEMS package. Microelectron Reliab 7(48):1557–1561 Li Q, Goosen JFL, Beek JTM (2008) Failure analysis of a thin-film nitride MEMS package. Microelectron Reliab 7(48):1557–1561
go back to reference Majcherek S, Leneke T, Hirsch S (2009) A silicon test chip for the thermomechanical analysis of MEMS packaging. Microsyst Technol 15:191–200CrossRef Majcherek S, Leneke T, Hirsch S (2009) A silicon test chip for the thermomechanical analysis of MEMS packaging. Microsyst Technol 15:191–200CrossRef
go back to reference Ni ZH (1989) Vibration mechanics. Xi’an JiaoTong University Press, Xi’an Ni ZH (1989) Vibration mechanics. Xi’an JiaoTong University Press, Xi’an
go back to reference Peng CT, Lin JC, Lin CT (2005) Performance and package effect of a novel piezoresistive pressure sensor fabricated by front-side etching technology. Sens Actuators A 119:28–37CrossRef Peng CT, Lin JC, Lin CT (2005) Performance and package effect of a novel piezoresistive pressure sensor fabricated by front-side etching technology. Sens Actuators A 119:28–37CrossRef
go back to reference Shi YB, Liu J, Qi XJ (2008) Fabrication and measurement of high-g MEMS accelerometer. Chin J Sci Instrum 7(29):1345–1349 Shi YB, Liu J, Qi XJ (2008) Fabrication and measurement of high-g MEMS accelerometer. Chin J Sci Instrum 7(29):1345–1349
go back to reference Song J, Huang QA, Li M (2009) Influence of environmental temperature on the dynamic properties of a die attached MEMS device. Microsyst Technol 6(15):925–932CrossRef Song J, Huang QA, Li M (2009) Influence of environmental temperature on the dynamic properties of a die attached MEMS device. Microsyst Technol 6(15):925–932CrossRef
go back to reference Spearing SM (2000) Materials issues in micro-electro-mechanical system (MEMS). Acta Mater 48:179–196CrossRef Spearing SM (2000) Materials issues in micro-electro-mechanical system (MEMS). Acta Mater 48:179–196CrossRef
go back to reference Tanner DM (2009) MEMS reliability: where are we now. Microeletron Reliab 49:937–940CrossRef Tanner DM (2009) MEMS reliability: where are we now. Microeletron Reliab 49:937–940CrossRef
go back to reference Tanner DM, Walraven JA, Helgesen K, Irwin LW, Brown F, Smith NF, Masters N (2000) MEMS reliability in shock environments. In: IEEE international reliability physics symposium, April 10–13. San Jose, CA, pp 129–138 Tanner DM, Walraven JA, Helgesen K, Irwin LW, Brown F, Smith NF, Masters N (2000) MEMS reliability in shock environments. In: IEEE international reliability physics symposium, April 10–13. San Jose, CA, pp 129–138
go back to reference Tao G, Yan X, Ping L (2011) Study on encapsulation and SMT technology for MEMS high-g acceleration sensors. Control Instrum Chem Ind 9(38):1133–1154 Tao G, Yan X, Ping L (2011) Study on encapsulation and SMT technology for MEMS high-g acceleration sensors. Control Instrum Chem Ind 9(38):1133–1154
go back to reference Teixeira V (2001) Numerical analysis of the influence of coating porosity and substrate elastic properties on the residual stresses in high temperature graded coatings. Surf Coat Technol 146:79–84CrossRef Teixeira V (2001) Numerical analysis of the influence of coating porosity and substrate elastic properties on the residual stresses in high temperature graded coatings. Surf Coat Technol 146:79–84CrossRef
go back to reference Walwakar SS, Cho J (2006) Evaluation of die stress in MEMS packaging: experimental and theoretical approaches. IEEE Trans Compon Packag Technol 29:735–742 Walwakar SS, Cho J (2006) Evaluation of die stress in MEMS packaging: experimental and theoretical approaches. IEEE Trans Compon Packag Technol 29:735–742
go back to reference Yang ZX, Huang Y, Li XX (2009) Investigation and simulation on the dynamic shock response performance of packaged high-g MEMS accelerometer versus the impurity concentration of the piezoresistor. Microelectron Reliab 5(49):510–516 Yang ZX, Huang Y, Li XX (2009) Investigation and simulation on the dynamic shock response performance of packaged high-g MEMS accelerometer versus the impurity concentration of the piezoresistor. Microelectron Reliab 5(49):510–516
Metadata
Title
Effects of package on the performance of MEMS piezoresistive accelerometers
Authors
Ping Li
Shiqiao Gao
Haipeng Liu
Jun Liu
Yunbo Shi
Publication date
01-08-2013
Publisher
Springer Berlin Heidelberg
Published in
Microsystem Technologies / Issue 8/2013
Print ISSN: 0946-7076
Electronic ISSN: 1432-1858
DOI
https://doi.org/10.1007/s00542-012-1711-x

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