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Published in: Journal of Materials Science: Materials in Electronics 9/2021

16-04-2021

Enhanced performance of OLED based on molecular orientation of emission layer by optimized substrate temperature

Authors: Dongyue Cui, Shuai Wang, Shuhong Li, Yunlong Liu, Hui Du, Qianqian Du, Ling Zhao, Wenjun Wang, Xiaochen Dong

Published in: Journal of Materials Science: Materials in Electronics | Issue 9/2021

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Abstract

Horizontally oriented transition dipole moment (TDM) of the molecule in emission layers (EMLs) can boost out-coupling efficiency, resulting in higher performance organic light-emitting diodes (OLEDs). As known, the substrate temperature (\(T_{s}\)) has a significant effect on the TDM of molecules. In this paper, the doped EMLs deposited with different \(T_{s}\) ranging from 30 to 100 °C were prepared and the corresponding photoluminescence quantum yield (PLQY) and TDM were measured. In addition, these EMLs with different \(T_{s}\) were employed to the OLED devices. The best luminous efficiency (51.4 cd/A), power efficiency (68.9 lm/W) and external quantum efficiency (EQE) (19.5%) were obtained in the OLED device where EMLs were deposited at 60 °C. However, the anisotropy factor \(\Theta\) at this temperature is not the best, which is inconsistent with the common rules that high \(\Theta\) causes high EQE. This phenomenon was ascribed to the in-situ annealing process for the hole transport layer (HTL) during the deposition of EMLs with different \(T_{s}\). The synergy of PLQY and TDM orientation of EMLs, the hole mobility of hole only devices (HODs) contribute to the high performance of OLED device at 60 °C.

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Metadata
Title
Enhanced performance of OLED based on molecular orientation of emission layer by optimized substrate temperature
Authors
Dongyue Cui
Shuai Wang
Shuhong Li
Yunlong Liu
Hui Du
Qianqian Du
Ling Zhao
Wenjun Wang
Xiaochen Dong
Publication date
16-04-2021
Publisher
Springer US
Published in
Journal of Materials Science: Materials in Electronics / Issue 9/2021
Print ISSN: 0957-4522
Electronic ISSN: 1573-482X
DOI
https://doi.org/10.1007/s10854-021-05836-3

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