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Published in: Journal of Materials Science: Materials in Electronics 5/2013

01-05-2013

Fractal analysis of side channels for breakdown structures in XLPE cable insulation

Authors: Huan Li, Jianying Li, Weiwei Li, Xuetong Zhao, Guoli Wang, Mohammad A. Alim

Published in: Journal of Materials Science: Materials in Electronics | Issue 5/2013

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Abstract

The role of frequency in the range 20 through 300 Hz on the breakdown voltage and the breakdown path is studied in cross-linked polyethylene (XLPE) cable insulation using embedded needle. A maximum breakdown voltage of 25 kV is found at 240 Hz, and side channels are observed on the flank of the main channel of the electrical breakdown path. Fractal analysis of the side channel is carried out and it is induced that the frequency dependence of the fractal dimension D of the side channel are similar to that of the electrical trees before breakdown. It is suggested that the space charge can be injected from the needle tip. This leads to partial discharge causing progress of the electrical tree and the breakdown path. Space charge will also result in field-moderating cloud around the needle tip and turn to sidewall charges in the side channels. The frequency dependence of the breakdown voltage of the XLPE with the embedded needle can be clarified based on the fractal analysis of the side channel and the electrical tree of the XLPE insulation.

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Literature
1.
go back to reference J.Y. Li, X.T. Zhao, F. Gu, S.T. Li, Defects and dc electrical degradation in CaCu3Ti4O12 ceramics: role of oxygen vacancy migration. Appl. Phys. Lett. 100, 202905 (2012)CrossRef J.Y. Li, X.T. Zhao, F. Gu, S.T. Li, Defects and dc electrical degradation in CaCu3Ti4O12 ceramics: role of oxygen vacancy migration. Appl. Phys. Lett. 100, 202905 (2012)CrossRef
2.
go back to reference J. Artbauer, Electric strength of polymers. J. Phys. D Appl. Phys. 29, 446–456 (1996)CrossRef J. Artbauer, Electric strength of polymers. J. Phys. D Appl. Phys. 29, 446–456 (1996)CrossRef
3.
go back to reference K.C. Kao, Dielectric Phenomena in Solids. (Elsevier Academic Press, London, 2004, Chapter 8, pp 515–567). ISBN: 0-12-396561-6 K.C. Kao, Dielectric Phenomena in Solids. (Elsevier Academic Press, London, 2004, Chapter 8, pp 515–567). ISBN: 0-12-396561-6
4.
go back to reference E.O. Forster, The search for universal features of electrical breakdown in solids, liquids and gases. IEEE Trans. Electr. Insul. 17, 517–521 (1982)CrossRef E.O. Forster, The search for universal features of electrical breakdown in solids, liquids and gases. IEEE Trans. Electr. Insul. 17, 517–521 (1982)CrossRef
5.
go back to reference L.A. Dissado, G. Mazzanti, G.C. Montanari, The incorporation of space charge degradation in the life model for electrical insulating materials. IEEE Trans. Dielectr. Electr. Insul. 2, 1147–1158 (1995)CrossRef L.A. Dissado, G. Mazzanti, G.C. Montanari, The incorporation of space charge degradation in the life model for electrical insulating materials. IEEE Trans. Dielectr. Electr. Insul. 2, 1147–1158 (1995)CrossRef
6.
go back to reference L. Niemeyer, L. Pietronero, H.J. Wiesmann, Fractal dimension of dielectric breakdown. Phys. Rev. Lett. 52, 1033–1037 (1984)CrossRef L. Niemeyer, L. Pietronero, H.J. Wiesmann, Fractal dimension of dielectric breakdown. Phys. Rev. Lett. 52, 1033–1037 (1984)CrossRef
7.
go back to reference H.J. Wiesmann, H.R. Zeller, A fractal model of dielectric breakdown and prebreakdown in solid dielectrics. J. Appl. Phys. 60(5), 1770–1773 (1986) H.J. Wiesmann, H.R. Zeller, A fractal model of dielectric breakdown and prebreakdown in solid dielectrics. J. Appl. Phys. 60(5), 1770–1773 (1986)
8.
go back to reference K. Wu, L.A. Dissado, T. Okamoto, Percolation model for electrical breakdown in insulating polymers. Appl. Phys. Lett. 85(19), 4454–4456 (2004) K. Wu, L.A. Dissado, T. Okamoto, Percolation model for electrical breakdown in insulating polymers. Appl. Phys. Lett. 85(19), 4454–4456 (2004)
9.
go back to reference R. Ross, Bias and standard deviation due to Weibull parameter estimation for small data sets. IEEE Trans. Dielectr. Electr. Insul. 3(1), 28–42 (1996) R. Ross, Bias and standard deviation due to Weibull parameter estimation for small data sets. IEEE Trans. Dielectr. Electr. Insul. 3(1), 28–42 (1996)
10.
go back to reference A.S. Xie, X.Q. Zheng, S.T. Li, G. Chen, Investigations of electrical trees in the inner layer of XLPE cable insulation using computer-aided image recording monitoring. IEEE Trans. Dielectr. Electr. Insul. 17(3), 685–693 (2010) A.S. Xie, X.Q. Zheng, S.T. Li, G. Chen, Investigations of electrical trees in the inner layer of XLPE cable insulation using computer-aided image recording monitoring. IEEE Trans. Dielectr. Electr. Insul. 17(3), 685–693 (2010)
11.
go back to reference L.A. Dissado, J.C. Fothergill, Electrical Degradation and Breakdown in Polymers: IEE Materials and Devices Series 9, (Peter Peregrinus Limited, London, 1992, Chapter 5, pp. 132–133), ISBN 0-86341-196-7 L.A. Dissado, J.C. Fothergill, Electrical Degradation and Breakdown in Polymers: IEE Materials and Devices Series 9, (Peter Peregrinus Limited, London, 1992, Chapter 5, pp. 132–133), ISBN 0-86341-196-7
12.
go back to reference W.W. Li, J.Y. Li, G.L. Yin, S.T. Li, J.K. Zhao, B.H. Ouyang, Y. Ohki, Frequency dependence of breakdown performance of XLPE with different artificial defects. IEEE Trans. Dielectr. Electr. Insul. 19(4), 1351–1359 (2012) W.W. Li, J.Y. Li, G.L. Yin, S.T. Li, J.K. Zhao, B.H. Ouyang, Y. Ohki, Frequency dependence of breakdown performance of XLPE with different artificial defects. IEEE Trans. Dielectr. Electr. Insul. 19(4), 1351–1359 (2012)
13.
go back to reference J.Y. Li, X.T. Zhao, G.L. Yin, S.T. Li, J.K. Zhao, B.H. Ouyang, The effect of accelerated water tree ageing on the properties of xlpe cable insulation. IEEE Trans. Dielectr. Electr. Insul. 18(5), 1562–1569 (2011) J.Y. Li, X.T. Zhao, G.L. Yin, S.T. Li, J.K. Zhao, B.H. Ouyang, The effect of accelerated water tree ageing on the properties of xlpe cable insulation. IEEE Trans. Dielectr. Electr. Insul. 18(5), 1562–1569 (2011)
Metadata
Title
Fractal analysis of side channels for breakdown structures in XLPE cable insulation
Authors
Huan Li
Jianying Li
Weiwei Li
Xuetong Zhao
Guoli Wang
Mohammad A. Alim
Publication date
01-05-2013
Publisher
Springer US
Published in
Journal of Materials Science: Materials in Electronics / Issue 5/2013
Print ISSN: 0957-4522
Electronic ISSN: 1573-482X
DOI
https://doi.org/10.1007/s10854-012-0988-y

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