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Published in: Journal of Materials Science: Materials in Electronics 5/2013

01-05-2013

Phase structure and microwave dielectric properties of Zr(Zn1/3Nb2/3)xTi2−xO6 (0.2 ≤ x ≤ 0.8) ceramics

Authors: Bin Tang, Shengquan Yu, Hetuo Chen, Shuren Zhang, Xiaohua Zhou

Published in: Journal of Materials Science: Materials in Electronics | Issue 5/2013

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Abstract

The phase structure, morphology and microwave dielectric properties of Zr(Zn1/3Nb2/3)xTi2−xO6 (0.2 ≤ x ≤ 0.8) ceramics were investigated as a function of the amount of (Zn1/3Nb2/3)4+ substitution by the solid-state reaction technique. X-ray diffraction analysis showed the co-existence of the solid solution ZrTiO4 (x = 0.2) or ZrTi2O6(x = 0.4–0.5) as the main phase and TiO2 as the second phase, and the single-phase region for substituted ZrTi2O6 was obtained with x ≥ 0.5. As increasing x from 0.2 to 0.8, the grain growth was promoted, moreover the dielectric constant εr and the temperature coefficient of resonant frequency τf dropped from 53.8 to 39.2 and from +106.2 to −25.5 ppm/°C respectively, and the Q × f values increased from 33,200 to 43,200 GHz. Ceramics with good microwave dielectric properties: εr = 41.7, Q × f = 42,100 GHz and τf = −15.5 ppm/°C was obtained at x = 0.6.

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Metadata
Title
Phase structure and microwave dielectric properties of Zr(Zn1/3Nb2/3)xTi2−xO6 (0.2 ≤ x ≤ 0.8) ceramics
Authors
Bin Tang
Shengquan Yu
Hetuo Chen
Shuren Zhang
Xiaohua Zhou
Publication date
01-05-2013
Publisher
Springer US
Published in
Journal of Materials Science: Materials in Electronics / Issue 5/2013
Print ISSN: 0957-4522
Electronic ISSN: 1573-482X
DOI
https://doi.org/10.1007/s10854-012-0955-7

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