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2017 | OriginalPaper | Chapter

3. GaN-on-Silicon CMOS-Compatible Process

Authors : Denis Marcon, Steve Stoffels

Published in: Power GaN Devices

Publisher: Springer International Publishing

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Abstract

To achieve high-volume manufacturing of GaN technology, GaN-on-Si wafers need to be processed in highly efficient and productive CMOS fabs. To achieve this objective, the GaN-on-Si epitaxy and processing technology need to be adapted to the strict standard of CMOS fabs. In this chapter, the challenges related to the growth and (Au-free) processing of 200-mm GaN-on-Si wafers in a CMOS fab are analyzed.

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Literature
1.
go back to reference Cheng K et al (2012) AlGaN/GaN/AlGaN double heterostructures grown on 200 mm silicon (111) substrates with high electron mobility. Appl Phys Express 5:011002CrossRef Cheng K et al (2012) AlGaN/GaN/AlGaN double heterostructures grown on 200 mm silicon (111) substrates with high electron mobility. Appl Phys Express 5:011002CrossRef
2.
3.
go back to reference De Jaeger B et al (2012) Au-free CMOS-compatible AlGaN/GaN HEMT processing on 200 mm Si substrates. In: Proceeding of ISPSD, pp 49–52 De Jaeger B et al (2012) Au-free CMOS-compatible AlGaN/GaN HEMT processing on 200 mm Si substrates. In: Proceeding of ISPSD, pp 49–52
4.
go back to reference Mishra UK et al (2002) AlGaN/GaN HEMTs: an overview of device operations and applications. Proc IEEE 90(6):1022–1031CrossRef Mishra UK et al (2002) AlGaN/GaN HEMTs: an overview of device operations and applications. Proc IEEE 90(6):1022–1031CrossRef
6.
go back to reference Marcon D et al (2015) Proceedings of SPIE 9363, Gallium nitride materials and devices X, 936311 (13 Mar 2015) Marcon D et al (2015) Proceedings of SPIE 9363, Gallium nitride materials and devices X, 936311 (13 Mar 2015)
7.
go back to reference Van Hove M et al (2012) CMOS process-compatible high-power low-leakage AlGaN/GaN MISHEMT on silicon. IEEE Electr Device Lett 33(05):667–669CrossRef Van Hove M et al (2012) CMOS process-compatible high-power low-leakage AlGaN/GaN MISHEMT on silicon. IEEE Electr Device Lett 33(05):667–669CrossRef
8.
go back to reference Lee HS et al (2011) AlGaN/GaN high-electron-mobility transistors fabricated through a Au-free technology. IEEE Electr Device Lett 32:623CrossRef Lee HS et al (2011) AlGaN/GaN high-electron-mobility transistors fabricated through a Au-free technology. IEEE Electr Device Lett 32:623CrossRef
9.
go back to reference Alomari M et al (2009) Au free ohmic contacts for high temperature InAlN/GaN HEMT’s. ECS Trans 25:33CrossRef Alomari M et al (2009) Au free ohmic contacts for high temperature InAlN/GaN HEMT’s. ECS Trans 25:33CrossRef
10.
go back to reference Malmros A et al (2011) Electrical properties, microstructure, and thermal stability of Ta-based ohmic contacts annealed at low temperature for GaN HEMTs. Semicond Sci Technol 26:075006CrossRef Malmros A et al (2011) Electrical properties, microstructure, and thermal stability of Ta-based ohmic contacts annealed at low temperature for GaN HEMTs. Semicond Sci Technol 26:075006CrossRef
11.
go back to reference Van Daele B, Van Tendeloo G, Ruythooren W, Derluyn J, Leys MR, Germain M (2005) The role of Al on ohmic contact formation on n-type GaN and AlGaNGaN. Appl Phys Lett 87(6):11–13. doi:10.1063/1.2008361 Van Daele B, Van Tendeloo G, Ruythooren W, Derluyn J, Leys MR, Germain M (2005) The role of Al on ohmic contact formation on n-type GaN and AlGaNGaN. Appl Phys Lett 87(6):11–13. doi:10.​1063/​1.​2008361
Metadata
Title
GaN-on-Silicon CMOS-Compatible Process
Authors
Denis Marcon
Steve Stoffels
Copyright Year
2017
DOI
https://doi.org/10.1007/978-3-319-43199-4_3