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Journal of Electronic Materials

Issue 8/2004

Content (14 Articles)

Regular Issue Paper

Normal-incidence mid-infrared Ge quantum-dot photodetector

Fei Liu, Song Tong, Jianlin Liu, Kang L. Wang

Regular Issue Paper

Infrared transmission spectra of Cd1−xZnxTe (x = 0.04) crystals

Li Yujie, Gu Zhi, Li Guoqiang, Jie Wangqi

Regular Issue Paper

Room-temperature photoluminescence of Ga0.96In0.04As0.11Sb0.89 lattice matched to InAs

K. D. Moiseev, A. Krier, Y. P. Yakovlev

Regular Issue Paper

Impurities in hydride gases part 2: Investigation of trace CO2 in the liquid and vapor phases of ultra-pure ammonia

Hans H. Funke, Jon Welchhans, Tadaharu Watanabe, Robert Torres, Virginia H. Houlding, Mark W. Raynor

Regular Issue Paper

Correlation of CdZnTe(211)B substrate surface morphology and HgCdTe(211)B epilayer defects

J. Zhao, Y. Chang, G. Badano, S. Sivananthan, J. Markunas, S. Lewis, J. H. Dinan, P. S. Wijewarnasuriya, Y. Chen, G. Brill, N. Dhar

Regular Issue Paper

Germanium-on-insulator substrates by wafer bonding

Clarence J. Tracy, Peter Fejes, N. David Theodore, Papu Maniar, Eric Johnson, Albert J. Lamm, Anthony M. Paler, Igor J. Malik, Philip Ong

Regular Issue Paper

Simulation of the potting effect on the high-G MEMS accelerometer

Yuqi Jiang, Maohua Du, Le Luo, Xinxin Li

Regular Issue Paper

Degradation of electroless Ni(P) under-bump metallization in Sn3.5Ag and Sn37Pb solders during high-temperature storage

W. -M. Chen, P. Mccloskey, P. Byrne, P. Cheasty, G. Duffy, J. F. Rohan, J. Boardman, A. Mulcahy, S. C. O’Mathuna

Regular Issue Paper

Influence of Si3N4 passivation on surface trapping in SiC metal-semiconductor field-effect transistors

Ho-Young Cha, Y. C. Choi, R. M. Thompson, V. Kaper, J. R. Shealy, L. F. Eastman, M. G. Spencer

Regular Issue Paper

GaAs-based metal-oxide semiconductor field-effect transistors with Al2O3 gate dielectrics grown by atomic layer deposition

P. D. Ye, G. D. Wilk, B. Yang, J. Kwo, H. -J. L. Gossmann, M. Frei, J. P. Mannaerts, M. Sergent, M. Hong, K. K. Ng, J. Bude

Regular Issue Paper

Formation of thermally stable Ni monosilicide using an inductively coupled plasma process

Young-Woo Ok, Chel-Jong Choi, Jeong-Tae Maeng, Tae-Yeon Seong

Regular Issue Paper

Creep properties of Sn-8Mass%Zn-3Mass%Bi lead-free alloy

Ikuo Shohji, Colin Gagg, William J. Plumbridge