2019 | OriginalPaper | Chapter
12. Scanning Microwave Impedance Microscopy (sMIM) in Electronic and Quantum Materials
Authors : Kurt A. Rubin, Yongliang Yang, Oskar Amster, David A. Scrymgeour, Shashank Misra
Published in: Electrical Atomic Force Microscopy for Nanoelectronics
Publisher: Springer International Publishing
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