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Semiconductors
Published in: Semiconductors 7/2020

01-07-2020 | SEMICONDUCTOR STRUCTURES, LOW-DIMENSIONAL SYSTEMS, AND QUANTUM PHENOMENA

Scattering Matrix Method for Calculating the Spontaneous-Emission Probability in Cylindrically Symmetric Structures

Authors: V. V. Nikolaev, K. A. Ivanov, K. M. Morozov, A. V. Belonovski

Published in: Semiconductors | Issue 7/2020

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Abstract

A method is developed for analyzing spontaneous-emission modification in cylindrically symmetric structures. A matrix method is developed for cylindrical structures. General expressions for the radiative-recombination rate are derived for an emitter placed at any point on the structure. Quantitative indicators for estimating radiative-recombination enhancement and suppression are determined; they can be considered as modal Purcell factors. An expression for the total Purcell factor is derived for an emission direction perpendicular to the symmetry axes of the medium; as well as an expression for the integral (total) Purcell factor for the emitter at the symmetry axis.
previous article AlGaInSbAs Solid Solutions Grown on InAs Substrates by Zone Recrystallization with a Temperature Gradient
next article 2D SiC/Si Structure: Electron States and Adsorbability

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Appendix
Available only for authorised users
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Metadata
Title
Scattering Matrix Method for Calculating the Spontaneous-Emission Probability in Cylindrically Symmetric Structures
Authors
V. V. Nikolaev
K. A. Ivanov
K. M. Morozov
A. V. Belonovski
Publication date
01-07-2020
Publisher
Pleiades Publishing
Published in
Semiconductors / Issue 7/2020
Print ISSN: 1063-7826
Electronic ISSN: 1090-6479
DOI
https://doi.org/10.1134/S1063782620070106

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