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Published in: Journal of Materials Science: Materials in Electronics 8/2014

01-08-2014

Significant modification to Bi-doped BaTiO3 by Sm in gaseous penetration process

Authors: Fangwei Wang, Sue Hao, Jialong Li, Jiatao Wang, Yang Gao, Yunfeng Shen, Songyi Wang

Published in: Journal of Materials Science: Materials in Electronics | Issue 8/2014

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Abstract

Gaseous penetration technique was adopted to improve the electrical conductivity of pure BiTiO3 powders and Bi-doped BiTiO3 (BBT) powders and gel precursors, which were all prepared by sol–gel method. The effects of Sm-penetration on the structure and electrical conductivity of BBT powders and gel precursors were investigated. It was observed that Sm-penetration had a very significant influence in decreasing the resistivity of the BaTiO3 based materials, especially for Sm-penetrated BBT gel precursors (SBBT-G) whose resistivity can reach to the lowest point of 2.15 Ωm. The dielectric properties of the BaTiO3 based materials has been investigated and revealed that dielectric constant of SBBT-G was negative while the dielectric loss increased to an extremely high value which was distinguished from Sm-penetrated BBT powders (SBBT-P). The temperature dependence of resistivity (R–T) of SBBT-P and SBBT-G was found to obey the Arrhenius law with activation energy calculated, respectively. These results together with the resistivity and frequency (R–F) relationship curve have shown the metallization transition of SBBT-G is obvious, which has a promising applied future. Through X-ray diffraction and Scanning electron microscope, we detected that all BaTiO3 based materials presented typical perovskite structure and the average grain size of SBBT-G was smaller and more uniform than that of SBBT-P.

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Metadata
Title
Significant modification to Bi-doped BaTiO3 by Sm in gaseous penetration process
Authors
Fangwei Wang
Sue Hao
Jialong Li
Jiatao Wang
Yang Gao
Yunfeng Shen
Songyi Wang
Publication date
01-08-2014
Publisher
Springer US
Published in
Journal of Materials Science: Materials in Electronics / Issue 8/2014
Print ISSN: 0957-4522
Electronic ISSN: 1573-482X
DOI
https://doi.org/10.1007/s10854-014-2054-4

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