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Published in: Journal of Materials Science: Materials in Electronics 5/2014

01-05-2014

Structural characterization of CdSe/ZnS core–shell quantum dots (QDs) using TEM/STEM observation

Authors: Huiyoun Shin, Dongseon Jang, Jaesung Hwang, Youngil Jang, Myungju Cho, Kyuho Park

Published in: Journal of Materials Science: Materials in Electronics | Issue 5/2014

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Abstract

CdSe/ZnS core–shell structured nano-crystal quantum dots (QDs) are ideal candidates for light-emission applications due to their high quantum efficiency, narrow-band, and particle-size-tunable photoluminescence. In particular, their small size results in the quantum confinement of semiconductor nano-crystals, which widens their energy gaps. In general, structural analyses of QDs using a transmission electron microscope (TEM) are very important due to the significantly small size of QDs. We were able to obtain structural information of CdSe/ZnS core–shell QDs using nano-beam diffraction by controlling the nano-probe of the dark field scanning TEM (DF-STEM) mode and strain analysis with high-resolution TEM (HRTEM)/STEM images. Furthermore, we could clearly distinguish the interface between the CdSe core and the ZnS shell from the strain analysis with the HRTEM/STEM images.

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Metadata
Title
Structural characterization of CdSe/ZnS core–shell quantum dots (QDs) using TEM/STEM observation
Authors
Huiyoun Shin
Dongseon Jang
Jaesung Hwang
Youngil Jang
Myungju Cho
Kyuho Park
Publication date
01-05-2014
Publisher
Springer US
Published in
Journal of Materials Science: Materials in Electronics / Issue 5/2014
Print ISSN: 0957-4522
Electronic ISSN: 1573-482X
DOI
https://doi.org/10.1007/s10854-014-1838-x

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