Skip to main content
Top
Published in: Journal of Materials Science: Materials in Electronics 5/2014

01-05-2014

AlN epilayers and nanostructures growth in a homebuilt alumina hot-wall high temperature chemical vapor deposition system

Authors: Dian Zhang, Fa-Min Liu, Yuan Yao, Xin-An Yang

Published in: Journal of Materials Science: Materials in Electronics | Issue 5/2014

Log in

Activate our intelligent search to find suitable subject content or patents.

search-config
loading …

Abstract

AlN epilayers and nanostructures were grown in the range from 500 to 1500 °C in a homebuilt alumina hot-wall high temperature chemical vapor deposition system. The results revealed that high quality AlN epilayers can be grown at high temperature beyond 1100 °C and versatile AlN nanostrctures can be grown at low temperature below 900 °C, enabling the system to tailor AlN structures just by changing the growth temperature. High growth temperature as well as low N/Al ratio was preferable to surface mobility of the adatoms and lateral growth, resulting in a series of morphology changes. Meanwhile, the crystal quality improved with the increasing growth temperature, as proved by the decreasing FWHM of (0002) plane rocking curve of the epilayer and narrowing peaks in θ-2θ XRD pattern of the nanostructures. The epitaixal relationship was proven to be AlN (0001) ‖ sapphire (0001) and AlN [1-210] ‖ sapphire [1-100]. The layer was in tensile stress state in several tens of nanometers range near the interface and turned into compressive stress state out of the range. Tens of atoms layers of sapphire interface were substituted for AlN lattice due to nitridation. Low growth temperature produced versatile AlN nanostructures, whose crystal structures varied from amorphous in 500 °C case to defective crystal in 700 °C case and improved crystallinity in 900 °C case.

Dont have a licence yet? Then find out more about our products and how to get one now:

Springer Professional "Wirtschaft+Technik"

Online-Abonnement

Mit Springer Professional "Wirtschaft+Technik" erhalten Sie Zugriff auf:

  • über 102.000 Bücher
  • über 537 Zeitschriften

aus folgenden Fachgebieten:

  • Automobil + Motoren
  • Bauwesen + Immobilien
  • Business IT + Informatik
  • Elektrotechnik + Elektronik
  • Energie + Nachhaltigkeit
  • Finance + Banking
  • Management + Führung
  • Marketing + Vertrieb
  • Maschinenbau + Werkstoffe
  • Versicherung + Risiko

Jetzt Wissensvorsprung sichern!

Springer Professional "Technik"

Online-Abonnement

Mit Springer Professional "Technik" erhalten Sie Zugriff auf:

  • über 67.000 Bücher
  • über 390 Zeitschriften

aus folgenden Fachgebieten:

  • Automobil + Motoren
  • Bauwesen + Immobilien
  • Business IT + Informatik
  • Elektrotechnik + Elektronik
  • Energie + Nachhaltigkeit
  • Maschinenbau + Werkstoffe




 

Jetzt Wissensvorsprung sichern!

Springer Professional "Wirtschaft"

Online-Abonnement

Mit Springer Professional "Wirtschaft" erhalten Sie Zugriff auf:

  • über 67.000 Bücher
  • über 340 Zeitschriften

aus folgenden Fachgebieten:

  • Bauwesen + Immobilien
  • Business IT + Informatik
  • Finance + Banking
  • Management + Führung
  • Marketing + Vertrieb
  • Versicherung + Risiko




Jetzt Wissensvorsprung sichern!

Literature
1.
go back to reference H. Morkoc, S. Strite, G.B. Gao, M.E. Lin, B. Sverdlov, M. Burns, J Appl Phys 76, 1363 (1994)CrossRef H. Morkoc, S. Strite, G.B. Gao, M.E. Lin, B. Sverdlov, M. Burns, J Appl Phys 76, 1363 (1994)CrossRef
3.
go back to reference S. Pietranico, S. Pommier, S. Lefebvre, Z. Khatir, S. Bontemps, Microelectron Reliab 49, 1260 (2009)CrossRef S. Pietranico, S. Pommier, S. Lefebvre, Z. Khatir, S. Bontemps, Microelectron Reliab 49, 1260 (2009)CrossRef
4.
go back to reference R.T. Bondokov, S.G. Mueller, K.E. Morgan, G.A. Slack, S. Schujman, M.C. Wood, J.A. Smart, L.J. Schowalter, J Cryst Growth 310, 4020 (2008)CrossRef R.T. Bondokov, S.G. Mueller, K.E. Morgan, G.A. Slack, S. Schujman, M.C. Wood, J.A. Smart, L.J. Schowalter, J Cryst Growth 310, 4020 (2008)CrossRef
5.
go back to reference M.A. Moreira, I. Doi, J.F. Souza, J.A. Diniz, Microelectron Eng 82, 802 (2011)CrossRef M.A. Moreira, I. Doi, J.F. Souza, J.A. Diniz, Microelectron Eng 82, 802 (2011)CrossRef
6.
go back to reference Epelbaum BM, Bickermann M, Winnacker A (2004) Second international symposium on acoustic wave devices for futrue mobile communication systems, 157 Epelbaum BM, Bickermann M, Winnacker A (2004) Second international symposium on acoustic wave devices for futrue mobile communication systems, 157
7.
8.
go back to reference D. Dharanipal, R. Mlcak, J. Chan, H.L. Tuller, J. Abell, W. Li, T.D. Moustaka, Proc Electrochem Soc PV 6, 287 (2004) D. Dharanipal, R. Mlcak, J. Chan, H.L. Tuller, J. Abell, W. Li, T.D. Moustaka, Proc Electrochem Soc PV 6, 287 (2004)
10.
go back to reference S. Nikishin, B. Borisov, V. Kuryatkov, M. Holtz, A. Gregory, Wendy L. Sarney, Anand V. Sampath, H. Shen, M. Wraback, A. Usikov, V. Dmitriev, J Mater Sci Mater Electron 19, 764 (2008)CrossRef S. Nikishin, B. Borisov, V. Kuryatkov, M. Holtz, A. Gregory, Wendy L. Sarney, Anand V. Sampath, H. Shen, M. Wraback, A. Usikov, V. Dmitriev, J Mater Sci Mater Electron 19, 764 (2008)CrossRef
11.
go back to reference H. He, L. Huang, M. Xiao, F. Yuechun, X. Shen, J. Zeng, J Mater Sci Mater Electron 24, 4499 (2013)CrossRef H. He, L. Huang, M. Xiao, F. Yuechun, X. Shen, J. Zeng, J Mater Sci Mater Electron 24, 4499 (2013)CrossRef
12.
go back to reference A. Kakanakova-Georgieva, R.R. Ciechonski, U. Fosberg, A. Lundskog, E. Janzén, Cryst Growth Des 9, 880 (2009)CrossRef A. Kakanakova-Georgieva, R.R. Ciechonski, U. Fosberg, A. Lundskog, E. Janzén, Cryst Growth Des 9, 880 (2009)CrossRef
13.
go back to reference M. Bickermann, B.M. Epelbaum, O. Filip, P. Heimann, M. Feneberg, S. Nagata, A. Winnacker, Phys Status Solidi C 7, 1743 (2010)CrossRef M. Bickermann, B.M. Epelbaum, O. Filip, P. Heimann, M. Feneberg, S. Nagata, A. Winnacker, Phys Status Solidi C 7, 1743 (2010)CrossRef
14.
go back to reference V.N. Jmerik, A.M. Mizerov, D.V. Nechaev, P.A. Aseev, A.A. Sitnikova, S.I. Troshkov, P.S. Kop’ev, S.V. Ivanov, J Cryst Growth 354, 188 (2012)CrossRef V.N. Jmerik, A.M. Mizerov, D.V. Nechaev, P.A. Aseev, A.A. Sitnikova, S.I. Troshkov, P.S. Kop’ev, S.V. Ivanov, J Cryst Growth 354, 188 (2012)CrossRef
15.
16.
go back to reference A. Kakanakova-Georgieva, D. Nilsson, E. Janzén, J Cryst Growth 338, 52 (2012)CrossRef A. Kakanakova-Georgieva, D. Nilsson, E. Janzén, J Cryst Growth 338, 52 (2012)CrossRef
17.
19.
go back to reference L.J. Schowalter, S.B. Schujman, W. Liu, M. Goorsky, M.C. Wood, J. Grandusky, F. Shahedipour-Sandvik, Phys Status Solidi a 203, 1667 (2006)CrossRef L.J. Schowalter, S.B. Schujman, W. Liu, M. Goorsky, M.C. Wood, J. Grandusky, F. Shahedipour-Sandvik, Phys Status Solidi a 203, 1667 (2006)CrossRef
20.
go back to reference M. Bichermann, O. Filip, B.M. Epelbaum, P. Heimann, M. Feneberg, B. Neuschl, K. Thonke, E. Wedler, A. Winnacker, J Cryst Growth 339, 13 (2012)CrossRef M. Bichermann, O. Filip, B.M. Epelbaum, P. Heimann, M. Feneberg, B. Neuschl, K. Thonke, E. Wedler, A. Winnacker, J Cryst Growth 339, 13 (2012)CrossRef
21.
go back to reference H. Matsubara, K. Mizuno, Y. Takeuchi, S. Harada, Y. Kitou, E. Okuno, T. Ujihara, Jpn J Appl Phys 52, 08JE17 (2013)CrossRef H. Matsubara, K. Mizuno, Y. Takeuchi, S. Harada, Y. Kitou, E. Okuno, T. Ujihara, Jpn J Appl Phys 52, 08JE17 (2013)CrossRef
22.
go back to reference M. Yonenura, K. Kamei, S. Munetoh, J Mater Sci Mater Electron 16, 197 (2005)CrossRef M. Yonenura, K. Kamei, S. Munetoh, J Mater Sci Mater Electron 16, 197 (2005)CrossRef
23.
24.
go back to reference Y. Katagiri, S. Kishino, K. Okuura, H. Miyake, K. Hiramatu, J Cryst Growth 311, 2831 (2009)CrossRef Y. Katagiri, S. Kishino, K. Okuura, H. Miyake, K. Hiramatu, J Cryst Growth 311, 2831 (2009)CrossRef
25.
go back to reference Y. Kumagai, T. Yamane, A. Koukitu, J Cryst Growth 28, 162 (2005) Y. Kumagai, T. Yamane, A. Koukitu, J Cryst Growth 28, 162 (2005)
26.
go back to reference T. Nagashima, M. Harada, H. Yanagi, Y. Kumagai, J Cryst Growth 300, 42 (2007)CrossRef T. Nagashima, M. Harada, H. Yanagi, Y. Kumagai, J Cryst Growth 300, 42 (2007)CrossRef
27.
go back to reference Derrick Shane Kamber (2008) Hydride Vapor Phase Epitaxy of Aluminum Nitride, Dissertation, University of California Santa Barbara Derrick Shane Kamber (2008) Hydride Vapor Phase Epitaxy of Aluminum Nitride, Dissertation, University of California Santa Barbara
28.
go back to reference K.-i. Eriguchi, H. Murakami, U. Panyukova, Y. Kumagai, S. Ohira, A. Koukitu, J Cryst Growth 298, 332 (2007)CrossRef K.-i. Eriguchi, H. Murakami, U. Panyukova, Y. Kumagai, S. Ohira, A. Koukitu, J Cryst Growth 298, 332 (2007)CrossRef
29.
go back to reference K.-i. Eriguchi, T. Hiratsuka, H. Murakami, Y. Kumagai, A. Koutitu, J Cryst Growth 310, 4016 (2008)CrossRef K.-i. Eriguchi, T. Hiratsuka, H. Murakami, Y. Kumagai, A. Koutitu, J Cryst Growth 310, 4016 (2008)CrossRef
30.
go back to reference D.F. Bliss, V.L. Tassev, D. Weyburne, J.S. Bailey, J Cryst Growth 250, 1 (2003)CrossRef D.F. Bliss, V.L. Tassev, D. Weyburne, J.S. Bailey, J Cryst Growth 250, 1 (2003)CrossRef
31.
go back to reference J. Tajima, H. Murakami, Y. Kumagai, K. Takada, A. Koukitu, J Cryst Growth 311, 837 (2009)CrossRef J. Tajima, H. Murakami, Y. Kumagai, K. Takada, A. Koukitu, J Cryst Growth 311, 837 (2009)CrossRef
32.
go back to reference W. Jie-Jun, Y. Katagiri, K. Okuura, D.-B. Li, H. Miyake, K. Hiramatsu, J Cryst Growth 311, 3801 (2009)CrossRef W. Jie-Jun, Y. Katagiri, K. Okuura, D.-B. Li, H. Miyake, K. Hiramatsu, J Cryst Growth 311, 3801 (2009)CrossRef
33.
34.
go back to reference J. Yang, T.-W. Liu, C.-W. Hsu, L.-C. Chen, K.-H. Chen, C.-C. Chen, Nanotechnology 17, S321 (2006)CrossRef J. Yang, T.-W. Liu, C.-W. Hsu, L.-C. Chen, K.-H. Chen, C.-C. Chen, Nanotechnology 17, S321 (2006)CrossRef
35.
36.
go back to reference Y. Gao, H. Mingzhe, C. Xiangcheng, Y. Qingfeng, J Mater Sci Mater Electron 24, 4008 (2013)CrossRef Y. Gao, H. Mingzhe, C. Xiangcheng, Y. Qingfeng, J Mater Sci Mater Electron 24, 4008 (2013)CrossRef
37.
go back to reference X. Song, Z. Guo, J. Zheng, L. Xingguo, Y. Pu, Nanotechnology 19, 1156091 (2008) X. Song, Z. Guo, J. Zheng, L. Xingguo, Y. Pu, Nanotechnology 19, 1156091 (2008)
38.
go back to reference Y. Kumagai, Y. Enatsu, M. Ishizuki, Y. Kubota, J. Tajima, T. Nagashima, H. Murakami, K. Takada, A. Koukitu, J Cryst Growth 312, 2530 (2010)CrossRef Y. Kumagai, Y. Enatsu, M. Ishizuki, Y. Kubota, J. Tajima, T. Nagashima, H. Murakami, K. Takada, A. Koukitu, J Cryst Growth 312, 2530 (2010)CrossRef
39.
go back to reference T.D. Moustakas, S.E. Mohney, S.J. Pearton, Proceedings of the third symposium on III–V nitride materials and processes. Electrochemical Soc 98, 130 (1999) T.D. Moustakas, S.E. Mohney, S.J. Pearton, Proceedings of the third symposium on III–V nitride materials and processes. Electrochemical Soc 98, 130 (1999)
40.
42.
go back to reference Sarad Bahadur Thapa (2010) Studies of AlN grown by MOVPE for electronic and optoelectronic applications. Dissertation, Ulm University Sarad Bahadur Thapa (2010) Studies of AlN grown by MOVPE for electronic and optoelectronic applications. Dissertation, Ulm University
43.
44.
go back to reference M. Iwaya, T. Takeuchi, S. Yamaguchi, C. Wetzel, H. Amano, I. Akasaki, Jpn J Appl Phys 37, 316 (1998)CrossRef M. Iwaya, T. Takeuchi, S. Yamaguchi, C. Wetzel, H. Amano, I. Akasaki, Jpn J Appl Phys 37, 316 (1998)CrossRef
45.
go back to reference D.G. Zhao, J.J. Zhu, Z.S. Liu, S.M. Zhang, H. Yang, D.S. Jiang, Appl Phys Lett 85, 1449 (2004) D.G. Zhao, J.J. Zhu, Z.S. Liu, S.M. Zhang, H. Yang, D.S. Jiang, Appl Phys Lett 85, 1449 (2004)
47.
go back to reference David B, Williams C, Barry Carter (2009) Transmission electron microscopy, A textbook for materials science (2009, Springer Science + Business Media, New York), p. 290 David B, Williams C, Barry Carter (2009) Transmission electron microscopy, A textbook for materials science (2009, Springer Science + Business Media, New York), p. 290
Metadata
Title
AlN epilayers and nanostructures growth in a homebuilt alumina hot-wall high temperature chemical vapor deposition system
Authors
Dian Zhang
Fa-Min Liu
Yuan Yao
Xin-An Yang
Publication date
01-05-2014
Publisher
Springer US
Published in
Journal of Materials Science: Materials in Electronics / Issue 5/2014
Print ISSN: 0957-4522
Electronic ISSN: 1573-482X
DOI
https://doi.org/10.1007/s10854-014-1861-y

Other articles of this Issue 5/2014

Journal of Materials Science: Materials in Electronics 5/2014 Go to the issue