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Published in: Journal of Materials Science: Materials in Electronics 8/2014

01-08-2014

Structural, electrical and piezoelectric properties of V-, Nb- and W-substituted CaBi4Ti4O15 ceramics

Authors: Xinhua He, Bin Wang, Xiaoyi Fu, Zhiwu Chen

Published in: Journal of Materials Science: Materials in Electronics | Issue 8/2014

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Abstract

The equimolar substitution of V5+, Nb5+ and W6+ ions in the B-site of CaBi4Ti4O15 (CBT) ceramics was performed, and their sintering characteristics and microstructures were investigated. The results indicated that V2O5 has a substantial effect on the structure and properties of CaBi4Ti4O15 ceramics compared to Nb2O5 and WO3. The V-substituted sample exhibited the lowest sintering temperature, the best sinterability and the lowest conductivity among all of these samples. The comparative Raman study of the V5+, Nb5+ and W6+ doping indicated that the Bi ions in the [Bi2O2]2+ layers are more stable than those at the A sites in the pseudo-perovskite blocks, and the volatilisation of Bi during sintering preferentially occurs at A sites in the pseudo-perovskite blocks. The decrease in the volatilisation of Bi in the V-doped sample helps to maintain the amount of Bi atoms in the pseudo-perovskite blocks and the stoichiometric composition of the ceramics resulting in excellent properties. In addition, the increase in Bi ions in the pseudo-perovskite structure and the dense microstructure with a closed-packed arrangement of small grains, which result from sintering of the ceramics at a low temperature, also contributed to the notable reduction in the electrical conductivity. In comparison to the Nb- and W-doped CBT ceramics, the V-doped samples exhibited a dual slope transition in the conductivity-temperature curves, a minimum conductivity over the measured temperature range and optimum piezoelectric properties.

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Metadata
Title
Structural, electrical and piezoelectric properties of V-, Nb- and W-substituted CaBi4Ti4O15 ceramics
Authors
Xinhua He
Bin Wang
Xiaoyi Fu
Zhiwu Chen
Publication date
01-08-2014
Publisher
Springer US
Published in
Journal of Materials Science: Materials in Electronics / Issue 8/2014
Print ISSN: 0957-4522
Electronic ISSN: 1573-482X
DOI
https://doi.org/10.1007/s10854-014-2031-y

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