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Published in: Journal of Materials Science: Materials in Electronics 4/2009

01-04-2009

Structural investigation of bismuth borate glass ceramics containing gadolinium ions by X-ray diffraction and FTIR spectroscopy

Authors: Petru Pascuta, Gheorghe Borodi, Eugen Culea

Published in: Journal of Materials Science: Materials in Electronics | Issue 4/2009

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Abstract

X-ray diffraction and FTIR spectroscopy measurements have been employed to investigate the xGd2O3 · (100 − x)[2Bi2O3 · B2O3] glass ceramics system, with 0  ≤ x ≤ 20 mol%. Heat treatment of glass samples at 625 °C for 24 h led to the formation of two crystalline phases. One crystalline phase is for the sample without gadolinium ions which belongs to the cubic system and another one is for the sample containing 20 mol% Gd2O3 which is orthorhombic with two unit cell parameters very close to each other. Between x = 0 mol% and x = 20 mol% there is a mixture of these crystalline phases. FTIR spectroscopy data suggest that the gadolinium ions play the network modifier role in the studied glasses. These data show that the glass structure consists of the BiO3, BiO6, BO3, and BO4 structural units, and the conversion among these units mainly depends on the Gd2O3 content.

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Metadata
Title
Structural investigation of bismuth borate glass ceramics containing gadolinium ions by X-ray diffraction and FTIR spectroscopy
Authors
Petru Pascuta
Gheorghe Borodi
Eugen Culea
Publication date
01-04-2009
Publisher
Springer US
Published in
Journal of Materials Science: Materials in Electronics / Issue 4/2009
Print ISSN: 0957-4522
Electronic ISSN: 1573-482X
DOI
https://doi.org/10.1007/s10854-008-9734-x

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