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Published in: Journal of Electronic Testing 4/2022

25-07-2022

Temperature and Humidity Controlled Test Bench for Temperature Sensor Characterization

Authors: Syed Usman Amin, Muhammad Aaquib Shahbaz, Syed Arsalan Jawed, Fahd Khan, Muhammad Junaid, Danish Kaleem, Musaddiq Siddiq, Zain Warsi, Naveed

Published in: Journal of Electronic Testing | Issue 4/2022

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Abstract

A temperature and humidity-controlled test bench for a wirelessly-powered ultra-low-power temperature sensor IC is presented. It consists of a closed metallic structure of 0.02 m3, forming a faraday-cage around the design under test (DUT), thermally insulated using Polyethylene foam, to provide electromagnetic interference (EMI) clean and thermally stable test environment with an operating temperature range of -10 °C to 100 °C. The temperature control with a settling accuracy of ± 0.6 °C is achieved with air-cooled 100 W Peltier modules, having fast dynamics to reach 95% of the required temperature within 15 min. The humidity is controlled by air circulation through a desiccant pocket, managed at around 15% to avoid water droplets during defrosting. A controllable vacuum of ~ 1.3 kPa is achieved through a vacuum pump when < 15% of de-humification is needed. The system operates at a lower power consumption of 30 W during the temperature retention phase, with acoustic noise of 58 dB-SPL achieved.

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Metadata
Title
Temperature and Humidity Controlled Test Bench for Temperature Sensor Characterization
Authors
Syed Usman Amin
Muhammad Aaquib Shahbaz
Syed Arsalan Jawed
Fahd Khan
Muhammad Junaid
Danish Kaleem
Musaddiq Siddiq
Zain Warsi
Naveed
Publication date
25-07-2022
Publisher
Springer US
Published in
Journal of Electronic Testing / Issue 4/2022
Print ISSN: 0923-8174
Electronic ISSN: 1573-0727
DOI
https://doi.org/10.1007/s10836-022-06013-y

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