Journal of Electronic Testing

Editorial

Vishwani D. Agrawal

The Newsletter of the Test Technology Technical Council of the IEEE Computer Society

Applying Artificial Neural Networks to Logic Built-in Self-test: Improving Test Point Insertion

Yang Sun, Spencer K. Millican

CMOS Implementation and Performance Analysis of Known Approximate 4:2 Compressors

Parthibaraj Anguraj, Thiruvenkadam Krishnan, Saravanan Subramanian

Efficient Design of Rounding Based Static Segment Imprecise Multipliers for Error Tolerance Application

D. Tilak Raju, Y. Srinivasa Rao

A New Approximate 4-2 Compressor using Merged Sum and Carry

Chinthalgiri Jyothi, K. Saranya, Bhaskara Rao Jammu, Sreehari Veeramachaneni, SK Noor Mahammad

Automated Design Error Debugging of Digital VLSI Circuits

Mohammed Moness, Lamya Gaber, Aziza I. Hussein, Hanafy M. Ali

Novel Fault-Tolerant Processing in Memory Cell in Ternary Quantum-Dot Cellular Automata

Leila Dehbozorgi, Reza Sabbaghi-Nadooshan, Alireza Kashaninia

Experimental and Simulation Results of Wien Bridge Oscillator Circuıt Realized wıth Op-Amp Designed Using a Memristor

İshak Parlar, M. Nuri Almali

Temperature and Humidity Controlled Test Bench for Temperature Sensor Characterization

Syed Usman Amin, Muhammad Aaquib Shahbaz, Syed Arsalan Jawed, Fahd Khan, Muhammad Junaid, Danish Kaleem, Musaddiq Siddiq, Zain Warsi, Naveed