Ausgabe 3/2023
Inhalt (10 Artikel)
Open Access
Modular Test Kit – A Modular Approach for Efficient and Function-Oriented Testing
Benedikt Jooß, Dieter Schramm
Investigation of Single Event Effects in a Resistive RAM Memory Array by Coupling TCAD and SPICE Simulations
K. Coulié, H. Aziza, W. Rahajandraibe
Low Overhead and High Stability Radiation-Hardened Latch for Double/Triple Node Upsets
Zhengfeng Huang, Hao Wang, Dongxing Ma, Huaguo Liang, Yiming Ouyang, Aibin Yan
BISCC: A Novel Approach to Built In State Consistency Checking For Quick Volume Validation of Mixed-Signal/RF Systems
Sabyasachi Deyati, Barry Muldrey, Abhijit Chatterjee
A Novel Metaheuristic Based Method for Software Mutation Test Using the Discretized and Modified Forrest Optimization Algorithm
Bahman Arasteh, Farhad Soleimanian Gharehchopogh, Peri Gunes, Farzad Kiani, Mahsa Torkamanian-Afshar
Multi-Objective Optimization Based Test Pattern Generation for Hardware Trojan Detection
Vijaypal Singh Rathor, Deepak Singh, Simranjit Singh, Mohit Sajwan