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Journal of Electronic Testing

Theory and Applications

Journal of Electronic Testing OnlineFirst articles


Fault Tolerance Mechanisms for FPGA-Based Regular Expression Matching

Traditional fault-tolerance techniques relying on spatial and temporal redundancy typically imply high power, delay, and area overheads. Cost-effective solutions often depend on system’s design and hardware platform at hand. Particularly for …


Thermal-aware SoC Test Scheduling with Voltage/Frequency Scaling and Test Partition

With increasing power density in modern integrated circuits, thermal issues are becoming a critical problem in System-on-a-Chip (SoC) testing. In this paper, we develop the thermal-aware test scheduling methods using Voltage/Frequency Scaling …


Test and Reliability in Approximate Computing

This paper presents an overview of test and reliability approaches for approximate computing architectures. We focus on how specific methods for test and reliability can be used to improve the characteristics of approximate computing in terms of …



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Über diese Zeitschrift

The Journal of Electronic Testing, the only journal specifically dedicated to electronic testing, is an international forum disseminating the latest research results and applications in the field. With its rapid submission to publication cycle, the journal quickly brings important findings to the attention of researchers and practitioners.

A partial list of topics covered in the journal includes testing of VLSI devices, printed circuit boards, and electronic systems; fault modeling and simulation; test generation; design for testability; electron beam test systems; formal verification of hardware; simulation for verification; design debugging; economics of testing; quality and reliability; and CAD Tools.

In addition to original research papers, the journal publishes conference papers of exceptional merit. Readers will also find surveys and reviews examining the state of the art in the field.

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