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Zeitschrift

Journal of Electronic Testing

Theory and Applications

Journal of Electronic Testing OnlineFirst articles

18.09.2021

Neural Network-based Online Fault Diagnosis in Wireless-NoC Systems

The recent development of wireless Network-on-Chip (WiNoC) by introducing wireless interface in traditional wired NoC has significantly increased the performance of NoC systems with higher bandwidth and low latency on-chip communication. However …

17.09.2021

Test Technology Newsletter

25.08.2021

Design of Radiation Hardened Latch and Flip-Flop with Cost-Effectiveness for Low-Orbit Aerospace Applications

To meet the requirements of both cost-effectiveness and high reliability for low-orbit aerospace applications, this paper first presents a radiation hardened latch design, namely HLCRT. The latch mainly consists of a single-node-upset …

24.08.2021

SC-COTD: Hardware Trojan Detection Based on Sequential/Combinational Testability Features using Ensemble Classifier

Security against Hardware Trojans (HT) is an important concern in integrated circuits (IC) design and fabrication. Most of the current HT detection methods are based on the golden model of circuit design. Further, some approaches require test …

14.08.2021

Fault-Aware Dependability Enhancement Techniques for Phase Change Memory

A variety of resistive memories have been proposed in recent years. Among these emerging technologies, phase change memory (PCM) has received the most research attentions since it has the advantages of high scalability, non-volatility, fast …

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Über diese Zeitschrift

The Journal of Electronic Testing, the only journal specifically dedicated to electronic testing, is an international forum disseminating the latest research results and applications in the field. With its rapid submission to publication cycle, the journal quickly brings important findings to the attention of researchers and practitioners.

A partial list of topics covered in the journal includes testing of VLSI devices, printed circuit boards, and electronic systems; fault modeling and simulation; test generation; design for testability; electron beam test systems; formal verification of hardware; simulation for verification; design debugging; economics of testing; quality and reliability; and CAD Tools.

In addition to original research papers, the journal publishes conference papers of exceptional merit. Readers will also find surveys and reviews examining the state of the art in the field.

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