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Journal of Electronic Testing OnlineFirst articles

18.11.2022

Effect of Sizing and Scaling on Power Dissipation and Resilience of an RHBD SRAM Circuit

Single Event Transients (SET) pose a growing challenge to reliability of memory circuits as the device dimensions continue to shrink. It is essential to assess the effect of decreasing technology lengths on the resilience and power dissipation of …

14.11.2015

Editorial

Über diese Zeitschrift

The Journal of Electronic Testing, the only journal specifically dedicated to electronic testing, is an international forum disseminating the latest research results and applications in the field. With its rapid submission to publication cycle, the journal quickly brings important findings to the attention of researchers and practitioners.

A partial list of topics covered in the journal includes testing of VLSI devices, printed circuit boards, and electronic systems; fault modeling and simulation; test generation; design for testability; electron beam test systems; formal verification of hardware; simulation for verification; design debugging; economics of testing; quality and reliability; and CAD Tools.

In addition to original research papers, the journal publishes conference papers of exceptional merit. Readers will also find surveys and reviews examining the state of the art in the field.

Metadaten
Titel
Journal of Electronic Testing
Abdeckung
Jahrgang 10/1997 - Jahrgang 38/2022
Verlag
Springer US
Elektronische ISSN
1573-0727
Print ISSN
0923-8174
Zeitschriften-ID
10836
DOI
https://doi.org/10.1007/10836.1573-0727