Journal of Electronic Testing

Editorial

Vishwani D. Agrawal

Test Technology Newsletter

Evaluating the Reliability of Different Voting Schemes for Fault Tolerant Approximate Systems

Tiago R. Balen, Carlos J. González, Ingrid F. V. Oliveira, Leomar S. da Rosa Jr, Rafael I. Soares, Rafael B. Schvittz, Nemitala Added, Eduardo L. A. Macchione, Vitor A. P. Aguiar, Marcilei A. Guazzelli, Nilberto H. Medina, Paulo F. Butzen

Diagnosis of Analog and Digital Circuit Faults Using Exponential Deep Learning Neural Network

R. Saravana Ram, M. Lordwin Cecil Prabhaker

New Second-order Threshold Implementation of Sm4 Block Cipher

Tianyi Shao, Bohua Wei, Yu Ou, Yongzhuang Wei, Xiaonian Wu

Threshold Analysis Using Probabilistic Xgboost Classifier for Hardware Trojan Detection

Tapobrata Dhar, Ranit Das, Chandan Giri, Surajit Kumar Roy

Structural and SCOAP Features Based Approach for Hardware Trojan Detection Using SHAP and Light Gradient Boosting Model

Richa Sharma, G. K. Sharma, Manisha Pattanaik, V. S. S. Prashant

E3C Techniques for Protecting NAND Flash Memories

Shyue-Kung Lu, Zeng-Long Tsai

Efficient Test and Characterization of Space Transmit-Receive Modules Using Scalable and Multipurpose Automated Test System

Vinod S Chippalkatti, Rajashekhar C Biradar, Venkatesh Shenoy, P Udayakumar

Online Diagnosis and Self-Recovery of Faulty Cells in Daisy-Chained MEDA Biochips Using Functional Actuation Patterns

Ling Zhang