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Journal of Electronic Testing

Ausgabe 2/2023

Inhalt (10 Artikel)

Editorial

Vishwani D. Agrawal

Design of INV/BUFF Logic Locking For Enhancing the Hardware Security

R. Naveenkumar, N. M. Sivamangai, A. Napolean, S. Sridevi Sathya Priya, S. V. Ashika

On the Use of the Indirect Test Strategy for Lifetime Performance Monitoring of RF Circuits

H. El Badawi, F. Azais, S. Bernard, M. Comte, V. Kerzerho, F. Lefevre

Open Access

Increased Detection of Hard-to-Detect Stuck-at Faults during Scan Shift

Hui Jiang, Fanchen Zhang, Jennifer Dworak, Kundan Nepal, Theodore Manikas

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