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Journal of Electronic Testing
Published in: Journal of Electronic Testing 4/2018

31-05-2018

Test and Reliability in Approximate Computing

Authors: Lorena Anghel, Mounir Benabdenbi, Alberto Bosio, Marcello Traiola, Elena Ioana Vatajelu

Published in: Journal of Electronic Testing | Issue 4/2018

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Abstract

This paper presents an overview of test and reliability approaches for approximate computing architectures. We focus on how specific methods for test and reliability can be used to improve the characteristics of approximate computing in terms of power consumption, area, life expectancy and precision. This paper does not address specification and design of approximate hardware/software/algorithms, but provides an in-depth knowledge on how the reliability and test related techniques can be efficiently used to maximize the benefits of approximate computing.
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Metadata
Title
Test and Reliability in Approximate Computing
Authors
Lorena Anghel
Mounir Benabdenbi
Alberto Bosio
Marcello Traiola
Elena Ioana Vatajelu
Publication date
31-05-2018
Publisher
Springer US
Published in
Journal of Electronic Testing / Issue 4/2018
Print ISSN: 0923-8174
Electronic ISSN: 1573-0727
DOI
https://doi.org/10.1007/s10836-018-5734-9

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