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Journal of Electronic Testing
Published in: Journal of Electronic Testing 1/2014

01-02-2014

Wide Dynamic Range CMOS Amplifier Design for RF Signal Power Detection via Electro-Thermal Coupling

Authors: Junpeng Feng, Marvin Onabajo

Published in: Journal of Electronic Testing | Issue 1/2014

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Abstract

A differential temperature sensor for on-chip signal and DC power monitoring is presented for built-in testing and calibration applications. The amplifiers in the sensor are designed with class AB output stages to extend the dynamic range of the temperature/power measurements. Two high-gain amplification stages are used to achieve high sensitivity to temperature differences at points close to devices under test. Designed in 0.18 μm CMOS technology, the sensor has a simulated sensitivity that is tunable up to 210 mV/°C with a corresponding dynamic range of 13 °C. The sensor consumes 2.23 mW from a 1.8 V supply. A low-power version of the sensor was designed that consumes 1.125 mW from a 1.8 V supply, which has a peak sensitivity of 185.7 mV/°C over a 8 °C dynamic range.
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Metadata
Title
Wide Dynamic Range CMOS Amplifier Design for RF Signal Power Detection via Electro-Thermal Coupling
Authors
Junpeng Feng
Marvin Onabajo
Publication date
01-02-2014
Publisher
Springer US
Published in
Journal of Electronic Testing / Issue 1/2014
Print ISSN: 0923-8174
Electronic ISSN: 1573-0727
DOI
https://doi.org/10.1007/s10836-013-5427-3

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