Issue 1/2014
Content (14 Articles)
Counterfeit Integrated Circuits: Detection, Avoidance, and the Challenges Ahead
Ujjwal Guin, Daniel DiMase, Mohammad Tehranipoor
A Comprehensive Framework for Counterfeit Defect Coverage Analysis and Detection Assessment
Ujjwal Guin, Daniel DiMase, Mohammad Tehranipoor
Applications of Boolean Satisfiability to Verification and Testing of Switch-Level Circuits
M. Favalli, M. Dalpasso
A Novel Wafer Manipulation Method for Yield Improvement and Cost Reduction of 3D Wafer-on-Wafer Stacked ICs
Bei Zhang, Vishwani D. Agrawal
Low Power Memory Built in Self Test Address Generator Using Clock Controlled Linear Feedback Shift Registers
K. Murali Krishna, M. Sailaja
Study of Low-Cost Electrical Test Strategies for Post-Silicon Yield Improvement of MEMS Convective Accelerometers
Ahmed Amine Rekik, Florence Azaïs, Frédérick Mailly, Pascal Nouet
Wide Dynamic Range CMOS Amplifier Design for RF Signal Power Detection via Electro-Thermal Coupling
Junpeng Feng, Marvin Onabajo
Clock Faults Induced Min and Max Delay Violations
D. Rossi, M. Omaña, J. M. Cazeaux, C. Metra, T. M. Mak
Simulation Based Framework for Accurately Estimating Dynamic Power-Supply Noise and Path Delay
Sushmita Kadiyala Rao, Ryan Robucci, Chintan Patel
Single-Event Transient Measurements on a DC/DC Pulse Width Modulator Using Heavy Ion, Proton, and Pulsed Laser
Y. Ren, A.-L. He, S.-T. Shi, G. Guo, L. Chen, S.-J. Wen, R. Wong, N. W. van Vonno, B. L. Bhuva