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Journal of Electronic Testing 3/2022
Journal of Electronic Testing

Issue 3/2022

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Table of Contents (9 Articles)

20-07-2022

Editorial
Vishwani D. Agrawal

02-08-2022

Test Technology Newsletter

07-06-2022

A Systematic Bit Selection Method for Robust SRAM PUFs
Wendong Wang, Adit D. Singh, Ujjwal Guin

30-05-2022

The Detection of Malicious Modifications in the FPGA
Kamran Zahid

30-06-2022

Cross-PUF Attacks: Targeting FPGA Implementation of Arbiter-PUFs
Trevor Kroeger, Wei Cheng, Jean-Luc Danger, Sylvain Guilley, Naghmeh Karimi

24-06-2022

Research on Analog Integrated Circuit Test Parameter Set Reduction Based on XGBoost
Yindong Xiao, Yutong Zeng, Qiong Wu, Ke Liu, Yanjun Li, Chong Hu

29-06-2022

A Source-code Aware Method for Software Mutation Testing Using Artificial Bee Colony Algorithm
Bahman Arasteh, Parisa Imanzadeh, Keyvan Arasteh, Farhad Soleimanian Gharehchopogh, Bagher Zarei

08-06-2022

Deep Soft Error Propagation Modeling Using Graph Attention Network
Junchi Ma, Zongtao Duan, Lei Tang

17-06-2022

Built-In Self-Test for Multi-Threshold NULL Convention Logic Asynchronous Circuits using Pipeline Stage Parallelism
Brett Sparkman, Scott C. Smith, Jia Di

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