2001 | OriginalPaper | Chapter
A Figure of Merit for Flash Memory Multi-Layer Tunnel Dielectrics
Authors : B. Govoreanu, P. Blomne, M. Rosmeulen, J. Van Houdt, K. De Meyer
Published in: Simulation of Semiconductor Processes and Devices 2001
Publisher: Springer Vienna
Included in: Professional Book Archive
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In this paper a figure of merit for evaluating the performance of multi-layer tunnel dielectrics for Flash memory applications is proposed. Further analysis provides an in-depth understanding of the multi-layer stacks and allows to select the most suitable stack for memory application.