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Published in: Journal of Computational Electronics 2/2020

12-02-2020

A novel model of avalanche current generation in the GaN HEMT equivalent circuit

Author: Gennadiy Z. Garber

Published in: Journal of Computational Electronics | Issue 2/2020

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Abstract

We consider the large-signal equivalent circuit of a field-effect transistor (FET) with characteristics and parameters calculated using a two-dimensional (2D) quasi-hydrodynamic model while taking into account the electron velocity overshoot. In accordance with this equivalent circuit when applied to an AlGaN/GaN high-electron-mobility transistor (HEMT), the avalanche current (in the feedback branch) is zero at all operating points. However, this contradicts the significant difference seen between the results of time-domain simulations of a radiofrequency (RF) amplifier in which the transistor is simulated using a 2D model that does versus does not include the avalanche multiplication of the charge carriers. We propose a new model for the avalanche current generation, based on such simulations including the avalanche multiplication and on the theory of impact-ionization avalanche transit-time (IMPATT) diodes. This model allows the synthesis of amplifiers with high power-added efficiency (PAE).

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Appendix
Available only for authorised users
Literature
1.
go back to reference Garber, G.Z.: Numerical modeling of the characteristics of nonlinear equivalent circuits for s.h.f. Schottky-gate GaAs field-effect transistors. Sov. Microelectron. 22, 202–207 (1991) Garber, G.Z.: Numerical modeling of the characteristics of nonlinear equivalent circuits for s.h.f. Schottky-gate GaAs field-effect transistors. Sov. Microelectron. 22, 202–207 (1991)
2.
go back to reference Garber, G.Z.: Method for simulating efficient RF operation of HEMTs. J. Comput. Electron. 17, 419–426 (2018)CrossRef Garber, G.Z.: Method for simulating efficient RF operation of HEMTs. J. Comput. Electron. 17, 419–426 (2018)CrossRef
3.
go back to reference Garber, G.Z.: Mathematical aspects of simulating efficient RF operation of HEMTs. J. Comput. Electron. 17, 1676–1684 (2018)CrossRef Garber, G.Z.: Mathematical aspects of simulating efficient RF operation of HEMTs. J. Comput. Electron. 17, 1676–1684 (2018)CrossRef
4.
go back to reference Nanjo, T., Imai, A., Kurahashi, K., Matsuda, T., Suita, M., Yagyu, E.: Effect of high-temperature annealing for single-Ni-layer gate in AlGaN/GaN high-electron-mobility transistors. Jpn. J. Appl. Phys. 55(5S), 05FK05-1–05FK05-6 (2016)CrossRef Nanjo, T., Imai, A., Kurahashi, K., Matsuda, T., Suita, M., Yagyu, E.: Effect of high-temperature annealing for single-Ni-layer gate in AlGaN/GaN high-electron-mobility transistors. Jpn. J. Appl. Phys. 55(5S), 05FK05-1–05FK05-6 (2016)CrossRef
6.
go back to reference Garber, G.Z.: Quasi-hydrodynamic modeling of heterostructure field-effect transistors. J. Commun. Technol. Electron. 48, 114–117 (2003) Garber, G.Z.: Quasi-hydrodynamic modeling of heterostructure field-effect transistors. J. Commun. Technol. Electron. 48, 114–117 (2003)
7.
go back to reference Lee, J.-W., Kumar, V., Adesida, I.: High-power-density 0.25 µm gate-length AlGaN/GaN high-electron-mobility transistors on semi-insulating 6H–SiC substrates. Jpn. J. Appl. Phys. 45(1A), 13–17 (2006)CrossRef Lee, J.-W., Kumar, V., Adesida, I.: High-power-density 0.25 µm gate-length AlGaN/GaN high-electron-mobility transistors on semi-insulating 6H–SiC substrates. Jpn. J. Appl. Phys. 45(1A), 13–17 (2006)CrossRef
8.
go back to reference Garber, G.Z.: Estimation of the accuracy of the microwave FET equivalent circuit using the quasi-hydrodynamic model of electron transport. Solid-State Electron. 103, 115–121 (2015)CrossRef Garber, G.Z.: Estimation of the accuracy of the microwave FET equivalent circuit using the quasi-hydrodynamic model of electron transport. Solid-State Electron. 103, 115–121 (2015)CrossRef
10.
go back to reference Zakharov, A.L., Martirosov, I.M.: Theory of electrical properties of avalanche multiplication in the reverse biased p–n junction. Phys. Tech. Semicond. 1, 1777–1786 (1967). (in Russian) Zakharov, A.L., Martirosov, I.M.: Theory of electrical properties of avalanche multiplication in the reverse biased pn junction. Phys. Tech. Semicond. 1, 1777–1786 (1967). (in Russian)
11.
go back to reference Ohno, Y., Nakao, T., Kishimoto, S., Maezawa, K., Mizutani, T.: Effects of surface passivation on breakdown of AlGaN/GaN high-electron-mobility transistors. Appl. Phys. Lett. 84, 2184–2186 (2004)CrossRef Ohno, Y., Nakao, T., Kishimoto, S., Maezawa, K., Mizutani, T.: Effects of surface passivation on breakdown of AlGaN/GaN high-electron-mobility transistors. Appl. Phys. Lett. 84, 2184–2186 (2004)CrossRef
12.
go back to reference Garber, G.Z.: Mathematical simulation for estimating the potential of the hydrogen-terminated diamond FET in the mm-wave range. J. Comput. Electron. 15, 181–190 (2016)CrossRef Garber, G.Z.: Mathematical simulation for estimating the potential of the hydrogen-terminated diamond FET in the mm-wave range. J. Comput. Electron. 15, 181–190 (2016)CrossRef
13.
go back to reference Shin, D.-H., Yom, I.-B., Kim, D.-W.: A decade-bandwidth distributed power amplifier MMIC using 0.25 μm GaN HEMT technology. J. Electromagn. Eng. Sci. 17(4), 178–180 (2017)CrossRef Shin, D.-H., Yom, I.-B., Kim, D.-W.: A decade-bandwidth distributed power amplifier MMIC using 0.25 μm GaN HEMT technology. J. Electromagn. Eng. Sci. 17(4), 178–180 (2017)CrossRef
14.
go back to reference Kim, S., Lee, M.-P., Hong, S.-J., Kim, D.-W.: Ku-band 50 W GaN HEMT power amplifier using asymmetric power combining of transistor cells. Micromachines 9, 619–626 (2018)CrossRef Kim, S., Lee, M.-P., Hong, S.-J., Kim, D.-W.: Ku-band 50 W GaN HEMT power amplifier using asymmetric power combining of transistor cells. Micromachines 9, 619–626 (2018)CrossRef
Metadata
Title
A novel model of avalanche current generation in the GaN HEMT equivalent circuit
Author
Gennadiy Z. Garber
Publication date
12-02-2020
Publisher
Springer US
Published in
Journal of Computational Electronics / Issue 2/2020
Print ISSN: 1569-8025
Electronic ISSN: 1572-8137
DOI
https://doi.org/10.1007/s10825-020-01452-2

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