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Published in: Journal of Materials Science: Materials in Electronics 8/2015

01-08-2015

Effects of coupled stressing and solid-state aging on the mechanical properties of Sn–58Bi–0.7Zn solder joint

Authors: Dongliang Ma, Ping Wu

Published in: Journal of Materials Science: Materials in Electronics | Issue 8/2015

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Abstract

The mechanical properties of coupled and aged Sn–58Bi–0.7Zn solder joint were respectively investigated in this study. During tensile tests, the ultimate tensile strength of electromigration and thermal aging coupled solder joint was ascribed to the weakening of the anode interface between intermetallic compounds and Bi layer. It was due to the Bi segregation which led to the formation of vacancies and stress concentration at the Cu–Sn–Zn/Cu–Zn interface in the aged solder joint. Nanoindentation results revealed that the creep resistance of coupled solder joint was higher than that of the aged solder joint, which was because the Bi layer could play a role of load transfer at the solder joint interface in coupled sample.

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Metadata
Title
Effects of coupled stressing and solid-state aging on the mechanical properties of Sn–58Bi–0.7Zn solder joint
Authors
Dongliang Ma
Ping Wu
Publication date
01-08-2015
Publisher
Springer US
Published in
Journal of Materials Science: Materials in Electronics / Issue 8/2015
Print ISSN: 0957-4522
Electronic ISSN: 1573-482X
DOI
https://doi.org/10.1007/s10854-015-3215-9

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