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Journal of Materials Engineering and Performance

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01-07-2014

XRD Study of NiTi Endodontic Files Using Synchrotron Radiation

Authors: Francisco Manuel Braz Fernandes, J. P. Oliveira, A. Machado, Norbert Schell

Published in: Journal of Materials Engineering and Performance | Issue 7/2014

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Abstract

Two types of endodontic files (ProFile and Mtwo) were studied in order to analyze the effect of geometry on the stress-induced martensitic (SIM) transformation during bending. The use of a fine beam spot of synchrotron radiation allowed a detailed structural characterization with a fine spatial resolution. Experimental evidence of the effect of the cross-section geometry on the stress localization giving rise to different degrees of SIM transformation is presented for the first time in the published literature.

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Title: XRD Study of NiTi Endodontic Files Using Synchrotron Radiation
Authors: Francisco Manuel Braz Fernandes
J. P. Oliveira
A. Machado
Norbert Schell
Publication date: 01-07-2014
Publisher: Springer US
Published in: Journal of Materials Engineering and Performance / Issue 7/2014
Print ISSN: 1059-9495
Electronic ISSN: 1544-1024
DOI: https://doi.org/10.1007/s11665-014-1056-y

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