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Published in: Journal of Materials Science: Materials in Electronics 8/2013

01-08-2013

A novel silver–aluminium high-temperature die attach nanopaste system: the effects of organic additives content on post-sintered attributes

Authors: Vemal Raja Manikam, Khairunisak Abdul Razak, Kuan Yew Cheong

Published in: Journal of Materials Science: Materials in Electronics | Issue 8/2013

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Abstract

An Ag–Al die attach material having a fixed Ag–Al nanoparticles weight percent content (80–20 %), as well as varying organic additives weight percent content was formulated. The total nanoparticle weight percent content was varied between 84.7 and 87.0 %. As the organic additives content in the Ag80–Al20 die attach material decreased from 15.3 to 13.0 %, the nanopaste’s viscosity increased. The die attach material was sintered at 380 °C for 30 min to form Ag2Al and Ag3Al compounds. With decreasing organics content from 15.3 to 13.0 %, the porosity of the post-sintered samples also decreased from 30 to 19 %, while the density increased from 2.36 to 6.42 g/cm3. The highest melting point was recorded for the sample with the least organic weight percent content at 519 °C. The coefficient of thermal expansion and electrical conductivity values varied between 6.99–7.74 × 10−6/ °C and 0.95–1.01 × 105 (ohm-cm)−1 respectively with decreasing organic content from 15.3 to 13.0 %. The electrical conductivity values recorded were higher than or equal to that of most solder alloy die attach materials. By changing the organic additives content in the Ag80–Al20 die attach material, suitable properties are obtained for high temperature die attach applications.

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Metadata
Title
A novel silver–aluminium high-temperature die attach nanopaste system: the effects of organic additives content on post-sintered attributes
Authors
Vemal Raja Manikam
Khairunisak Abdul Razak
Kuan Yew Cheong
Publication date
01-08-2013
Publisher
Springer US
Published in
Journal of Materials Science: Materials in Electronics / Issue 8/2013
Print ISSN: 0957-4522
Electronic ISSN: 1573-482X
DOI
https://doi.org/10.1007/s10854-013-1155-9

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