Skip to main content
Top
Published in: Journal of Materials Science: Materials in Electronics 9/2018

13-02-2018

Effects of α-Al2O3 nanoparticles-doped on microstructure and properties of Sn–0.3Ag–0.7Cu low-Ag solder

Authors: Jie Wu, Songbai Xue, Jingwen Wang, Mingfang Wu, Jianhao Wang

Published in: Journal of Materials Science: Materials in Electronics | Issue 9/2018

Log in

Activate our intelligent search to find suitable subject content or patents.

search-config
loading …

Abstract

In order to enhance the properties of Sn–0.3Ag–0.7Cu low-Ag solder, α-Al2O3 nanoparticles with various content (0–0.5 wt%) were successfully doped into the solder paste with a self-designed dispersion step. After comprehensive study of the microstructures and properties of the novel nano-composite solder, several satisfactory modified results can be obtained. For instance, the wettability of solder was greatly improved with trace amount of α-Al2O3 nanoparticles-doped. The superior wettability was achieved by Sn–0.3Ag–0.7Cu–0.12Al2O3 solder with spreading area approaching to ~ 79 mm2. Detailed thermodynamic and kinetic analysis of how α-Al2O3 nanoparticles promoting the processes of solder wetting and spreading on Cu substrate were given. In addition, the joint soldered with Sn–0.3Ag–0.7Cu–0.12Al2O3 displayed the highest shear force (57.1 N) with a typical ductile fracture failure mode. This relates to the evidently refined microstructure as well as the well-controlled growth of interfacial Cu6Sn5 IMCs. Corresponding theoretical analysis shows 0.12 wt% Al2O3 nanoparticles-doped can decrease the growth rate constant of interfacial Cu6Sn5 IMCs from 5.08 × 10−10 to 1.71 × 10−10 cm2/s.

Dont have a licence yet? Then find out more about our products and how to get one now:

Springer Professional "Wirtschaft+Technik"

Online-Abonnement

Mit Springer Professional "Wirtschaft+Technik" erhalten Sie Zugriff auf:

  • über 102.000 Bücher
  • über 537 Zeitschriften

aus folgenden Fachgebieten:

  • Automobil + Motoren
  • Bauwesen + Immobilien
  • Business IT + Informatik
  • Elektrotechnik + Elektronik
  • Energie + Nachhaltigkeit
  • Finance + Banking
  • Management + Führung
  • Marketing + Vertrieb
  • Maschinenbau + Werkstoffe
  • Versicherung + Risiko

Jetzt Wissensvorsprung sichern!

Springer Professional "Technik"

Online-Abonnement

Mit Springer Professional "Technik" erhalten Sie Zugriff auf:

  • über 67.000 Bücher
  • über 390 Zeitschriften

aus folgenden Fachgebieten:

  • Automobil + Motoren
  • Bauwesen + Immobilien
  • Business IT + Informatik
  • Elektrotechnik + Elektronik
  • Energie + Nachhaltigkeit
  • Maschinenbau + Werkstoffe




 

Jetzt Wissensvorsprung sichern!

Springer Professional "Wirtschaft"

Online-Abonnement

Mit Springer Professional "Wirtschaft" erhalten Sie Zugriff auf:

  • über 67.000 Bücher
  • über 340 Zeitschriften

aus folgenden Fachgebieten:

  • Bauwesen + Immobilien
  • Business IT + Informatik
  • Finance + Banking
  • Management + Führung
  • Marketing + Vertrieb
  • Versicherung + Risiko




Jetzt Wissensvorsprung sichern!

Literature
2.
3.
go back to reference J. Wang, H.M. Wei, P. He, T.S. Lin, F.J. Lu, J. Electron. Mater. 44(10), 3872–3879 (2015)CrossRef J. Wang, H.M. Wei, P. He, T.S. Lin, F.J. Lu, J. Electron. Mater. 44(10), 3872–3879 (2015)CrossRef
4.
go back to reference M.L. Huang, N. Zhao, S. Liu, Y.Q. He, Trans. Nonferrous Met. Soc. China 26(6), 1663–1669 (2016)CrossRef M.L. Huang, N. Zhao, S. Liu, Y.Q. He, Trans. Nonferrous Met. Soc. China 26(6), 1663–1669 (2016)CrossRef
5.
go back to reference H.W. Chiang, K. Chang, J.Y. Chen, J. Electron. Mater. 35(12), 2074–2080 (2016)CrossRef H.W. Chiang, K. Chang, J.Y. Chen, J. Electron. Mater. 35(12), 2074–2080 (2016)CrossRef
6.
go back to reference F.X. Che, W.H. Zhu, S.W. Edith, X.W. Poh, X.R. Zhang, Zhang, J. Alloy. Compd. 507(1), 215–224 (2010)CrossRef F.X. Che, W.H. Zhu, S.W. Edith, X.W. Poh, X.R. Zhang, Zhang, J. Alloy. Compd. 507(1), 215–224 (2010)CrossRef
7.
go back to reference M. Yang, Y.H. Ko, J.H. Bang, T.S. Kim, C.W. Lee, M.Y. Li, Mater. Charact. 124, 250–259 (2017)CrossRef M. Yang, Y.H. Ko, J.H. Bang, T.S. Kim, C.W. Lee, M.Y. Li, Mater. Charact. 124, 250–259 (2017)CrossRef
8.
go back to reference G. Zeng, S.B. Xue, L. Zhang, L.L. Gao, W. Dai, J.D. Luo, J. Mater. Sci. Mater. Electron. 21(5), 421–440 (2010)CrossRef G. Zeng, S.B. Xue, L. Zhang, L.L. Gao, W. Dai, J.D. Luo, J. Mater. Sci. Mater. Electron. 21(5), 421–440 (2010)CrossRef
9.
11.
go back to reference A.A. El-Daly, A.E. Hammad, G.S. Al-Ganainy, M. Ragab, Mater. Sci. Eng. A 608, 130–138 (2014)CrossRef A.A. El-Daly, A.E. Hammad, G.S. Al-Ganainy, M. Ragab, Mater. Sci. Eng. A 608, 130–138 (2014)CrossRef
12.
go back to reference J. Wu, S.B. Xue, J.W. Wang, J.X. Wang, S. Liu, J. Mater. Sci. Mater. Electron. 28(14), 10230–10244 (2017)CrossRef J. Wu, S.B. Xue, J.W. Wang, J.X. Wang, S. Liu, J. Mater. Sci. Mater. Electron. 28(14), 10230–10244 (2017)CrossRef
13.
go back to reference J.C. Xu, S.B. Xue, P. Xue, W.M. Long, Q.K. Zhang, J. Mater. Sci. Mater. Electron. 27(8), 8771–8777 (2016)CrossRef J.C. Xu, S.B. Xue, P. Xue, W.M. Long, Q.K. Zhang, J. Mater. Sci. Mater. Electron. 27(8), 8771–8777 (2016)CrossRef
14.
go back to reference W.X. Chen, S.B. Xue, H. Wang, Y.H. Hu, J.X. Wang, J. Mater. Sci. Mater. Electron. 21(7), 719–725 (2010)CrossRef W.X. Chen, S.B. Xue, H. Wang, Y.H. Hu, J.X. Wang, J. Mater. Sci. Mater. Electron. 21(7), 719–725 (2010)CrossRef
15.
go back to reference Q.K. Zhang, W.M. Long, X.Q. Yu, Y.Y. Pei, P.X. Qiao, J. Alloy. Compd. 622, 973–978 (2015)CrossRef Q.K. Zhang, W.M. Long, X.Q. Yu, Y.Y. Pei, P.X. Qiao, J. Alloy. Compd. 622, 973–978 (2015)CrossRef
16.
go back to reference Y.L. Huang, Z.Y. Xiu, G.H. Wu, Y.H. Tian, P. He, J. Mater. Sci. Mater. Electron. 27(7), 6809–6815 (2016)CrossRef Y.L. Huang, Z.Y. Xiu, G.H. Wu, Y.H. Tian, P. He, J. Mater. Sci. Mater. Electron. 27(7), 6809–6815 (2016)CrossRef
17.
go back to reference X.L. Qiu, H.M. Wei, Q. Wang, P. He, T.S. Lin, F.J. Lu, Mater. Sci. Technol. 23(1), 20–24 (2015) X.L. Qiu, H.M. Wei, Q. Wang, P. He, T.S. Lin, F.J. Lu, Mater. Sci. Technol. 23(1), 20–24 (2015)
18.
go back to reference X.C. Lv, T.S. Lin, J. Wang, A. Jing, P. He, Mater. Trans. 54(7), 1228–1231 (2013)CrossRef X.C. Lv, T.S. Lin, J. Wang, A. Jing, P. He, Mater. Trans. 54(7), 1228–1231 (2013)CrossRef
19.
go back to reference L. Zhang, K.N. Tu, Mater. Sci. Eng. R 82(1), 1–32 (2014) L. Zhang, K.N. Tu, Mater. Sci. Eng. R 82(1), 1–32 (2014)
20.
go back to reference T. Fouzder, Q.Q. Li, Y.C. Chan, D.K. Chan, J. Mater. Sci. Mater. Electron. 25(9), 4012–4023 (2014)CrossRef T. Fouzder, Q.Q. Li, Y.C. Chan, D.K. Chan, J. Mater. Sci. Mater. Electron. 25(9), 4012–4023 (2014)CrossRef
21.
go back to reference L. Zhang, X.Y. Fan, Y.H. Guo, C.W. He, Electron. Mater. Lett. 10(3), 645–647 (2014)CrossRef L. Zhang, X.Y. Fan, Y.H. Guo, C.W. He, Electron. Mater. Lett. 10(3), 645–647 (2014)CrossRef
22.
go back to reference X.D. Liu, Y.D. Han, H.Y. Jing, J. Wei, L.Y. Xu, Mater. Sci. Eng. A 562, 25–32 (2013)CrossRef X.D. Liu, Y.D. Han, H.Y. Jing, J. Wei, L.Y. Xu, Mater. Sci. Eng. A 562, 25–32 (2013)CrossRef
23.
go back to reference K.M. Kumar, V. Kripesh, A.A.O. Tay, J. Alloy. Compd. 450(1–2), 229–237 (2008)CrossRef K.M. Kumar, V. Kripesh, A.A.O. Tay, J. Alloy. Compd. 450(1–2), 229–237 (2008)CrossRef
24.
25.
go back to reference A.K. Gain, Y.C. Chan, W.K.C. Yung, Microelectron. Reliab. 51(12), 2306–2313 (2011)CrossRef A.K. Gain, Y.C. Chan, W.K.C. Yung, Microelectron. Reliab. 51(12), 2306–2313 (2011)CrossRef
26.
go back to reference A. Fawzy, S.A. Fayek, M. Sobhy, E. Nassr, M.M. Mousa, G. Saad, J. Mater. Sci. Mater. Electron. 24(9), 3210–3218 (2013)CrossRef A. Fawzy, S.A. Fayek, M. Sobhy, E. Nassr, M.M. Mousa, G. Saad, J. Mater. Sci. Mater. Electron. 24(9), 3210–3218 (2013)CrossRef
27.
go back to reference L. Sun, L. Zhang, L. Xu, S.J. Zhong, J. Ma, B. Li, J. Mater. Sci. Mater. Electron. 27(7), 7665–7673 (2016)CrossRef L. Sun, L. Zhang, L. Xu, S.J. Zhong, J. Ma, B. Li, J. Mater. Sci. Mater. Electron. 27(7), 7665–7673 (2016)CrossRef
28.
go back to reference L. Yang, J.G. Ge, Y.C. Zhang, J. Dai, Y.F. Jing, J. Mater. Sci. Mater. Electron. 26(1), 613–619 (2015)CrossRef L. Yang, J.G. Ge, Y.C. Zhang, J. Dai, Y.F. Jing, J. Mater. Sci. Mater. Electron. 26(1), 613–619 (2015)CrossRef
29.
go back to reference Y. Gu, X.C. Zhao, Y. Li, Y. Liu, Y. Wang, Z.Y. Li, J. Alloy. Compd. 627, 39–47 (2015)CrossRef Y. Gu, X.C. Zhao, Y. Li, Y. Liu, Y. Wang, Z.Y. Li, J. Alloy. Compd. 627, 39–47 (2015)CrossRef
30.
go back to reference W.Q. Xing, X.Y. Yu, H. Li, L. Ma, W. Zuo, P. Dong, W.X. Wang, M. Ding, J. Alloy. Compd. 695, 574–582 (2017)CrossRef W.Q. Xing, X.Y. Yu, H. Li, L. Ma, W. Zuo, P. Dong, W.X. Wang, M. Ding, J. Alloy. Compd. 695, 574–582 (2017)CrossRef
31.
go back to reference L.C. Tsao, R.W. Wu, T.H. Cheng, K.H. Fan, R.S. Chen, Mater. Des. 50(17), 774–781 (2013)CrossRef L.C. Tsao, R.W. Wu, T.H. Cheng, K.H. Fan, R.S. Chen, Mater. Des. 50(17), 774–781 (2013)CrossRef
32.
go back to reference J. Xiao, Y. Wan, J. Li, Chin. J. Nonferrous Met. 16(12), 2120–2125 (2016) J. Xiao, Y. Wan, J. Li, Chin. J. Nonferrous Met. 16(12), 2120–2125 (2016)
33.
go back to reference C.J. Lu, Z.Z. Zhang, J.Q. Zhou, S.M. Zhang, Mater. Rev. 21(8), 165–166 (2007) C.J. Lu, Z.Z. Zhang, J.Q. Zhou, S.M. Zhang, Mater. Rev. 21(8), 165–166 (2007)
34.
go back to reference R.N. Han, S.B. Xue, Y.H. Hu, Z.Y. Wang, J.Y. Ja, Trans. China Weld. Inst. 33(10), 101–104 (2012) R.N. Han, S.B. Xue, Y.H. Hu, Z.Y. Wang, J.Y. Ja, Trans. China Weld. Inst. 33(10), 101–104 (2012)
35.
36.
go back to reference Q.J. Zhai, S.K. Guan, Q.Y. Shang, Calphad-Computer Coupling of Phase Diagrams & Thermochemistry (Industry Press, Beijing, 1999), p. 142 Q.J. Zhai, S.K. Guan, Q.Y. Shang, Calphad-Computer Coupling of Phase Diagrams & Thermochemistry (Industry Press, Beijing, 1999), p. 142
37.
go back to reference A. Roshanghias, J. Vrestal, A. Yakymovych, K.W. Richter, H. Ipser, Calphad 49, 101–109 (2015)CrossRef A. Roshanghias, J. Vrestal, A. Yakymovych, K.W. Richter, H. Ipser, Calphad 49, 101–109 (2015)CrossRef
Metadata
Title
Effects of α-Al2O3 nanoparticles-doped on microstructure and properties of Sn–0.3Ag–0.7Cu low-Ag solder
Authors
Jie Wu
Songbai Xue
Jingwen Wang
Mingfang Wu
Jianhao Wang
Publication date
13-02-2018
Publisher
Springer US
Published in
Journal of Materials Science: Materials in Electronics / Issue 9/2018
Print ISSN: 0957-4522
Electronic ISSN: 1573-482X
DOI
https://doi.org/10.1007/s10854-018-8727-7

Other articles of this Issue 9/2018

Journal of Materials Science: Materials in Electronics 9/2018 Go to the issue