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Published in: Journal of Computational Electronics 2/2016

23-02-2016

Large-signal characterization of millimeter-wave IMPATTs: effect of reduced impact ionization rate of charge carriers due to carrier-carrier interactions

Authors: Prasit Kumar Bandyopadhyay, Subhendu Chakraborty, Arindam Biswas, Aritra Acharyya, A. K. Bhattacharjee

Published in: Journal of Computational Electronics | Issue 2/2016

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Abstract

In this paper, we study the effect of energy loss of charge carriers due to carrier-carrier interactions prior to impact ionization on the static and large-signal characteristics of double-drift region impact avalanche transit time (IMPATT) diodes based on Si designed to operate at millimeter-wave (mm-wave) atmospheric window frequencies such as 94, 140, and 220 GHz. The above mentioned effect has been incorporated in the simulation by taking into account a recently reported generalized analytical model of impact ionization rate of charge carriers based on multistage scattering phenomena in the base semiconductor. Results are compared with static and large-signal signal simulation results of the same diodes that we have reported earlier by taking into account the empirical relation of ionization rates fitted from the experimental data (experiment was carried out on IMPATT structures suitable for operating near 100 GHz). It is observed that both the large-signal RF power output and DC to RF conversion efficiency of the diodes are deteriorated significantly due to reduced ionization rates as a consequence of carrier-carrier collision events prior to the impact ionization. This effect is found to be more pronounced in 140 and 220 GHz diodes due to the enhanced carrier-carrier collisions within those diodes having greater background doping densities as compared to 94 GHz diode. The simulation results presented in this paper found to be in closer agreement with the experimental results as compared to the results that we have reported earlier.

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Metadata
Title
Large-signal characterization of millimeter-wave IMPATTs: effect of reduced impact ionization rate of charge carriers due to carrier-carrier interactions
Authors
Prasit Kumar Bandyopadhyay
Subhendu Chakraborty
Arindam Biswas
Aritra Acharyya
A. K. Bhattacharjee
Publication date
23-02-2016
Publisher
Springer US
Published in
Journal of Computational Electronics / Issue 2/2016
Print ISSN: 1569-8025
Electronic ISSN: 1572-8137
DOI
https://doi.org/10.1007/s10825-016-0799-0

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