Issue 2/2020
Content (12 Articles)
Remaining Useful Life Prediction of Analog Circuit Using Improved Unscented Particle Filter
S. Rathnapriya, V. Manikandan
Design and Optimization Methodology of Coplanar Waveguide Test Structures for Dielectric Characterization of Thin Films
Jinqun Ge, Tian Xia, Guoan Wang
Investigations on the Use of Ensemble Methods for Specification-Oriented Indirect Test of RF Circuits
H. El Badawi, Florence Azais, S. Bernard, M. Comte, V. Kerzerho, F. Lefevre
An Efficient Algorithm for Optimizing the Test Path of Digital Microfluidic Biochips
Xijun Huang, Chuanpei Xu, Long Zhang
Automated Bug Resistant Test Intent with Register Header Database for Optimized Verification
Gaurav Sharma, Lava Bhargava, Vinod Kumar
Co-Optimization of Test Wrapper Length and TSV for TSV Based 3D SOCs
Tanusree Kaibartta, G. P. Biswas, Debesh Kumar Das
Soft Error Hardened Asymmetric 10T SRAM Cell for Aerospace Applications
Ambika Prasad Shah, Santosh Kumar Vishvakarma, Michael Hübner
Comparing the Impact of Power Supply Voltage on CMOS- and FinFET-Based SRAMs in the Presence of Resistive Defects
T. Copetti, T. R. Balen, E. Brum, C. Aquistapace, L. Bolzani Poehls