Skip to main content
Top
Published in: Journal of Materials Science 12/2017

02-03-2017 | Original Paper

Micromechanical behavior of single-crystalline Cu6Sn5 by picoindentation

Authors: J. J. Yu, J. Y. Wu, L. J. Yu, H. W. Yang, C. R. Kao

Published in: Journal of Materials Science | Issue 12/2017

Log in

Activate our intelligent search to find suitable subject content or patents.

search-config
loading …

Abstract

The micromechanical behavior of single-crystalline Cu6Sn5 is studied by micropillar compression in a picoindenter. The compound Cu6Sn5 is important because it is used as a structural material in microbumps of advanced electronic packages. Micropillars of Cu6Sn5 with known crystallographic orientations were fabricated by focused ion beam machining. Pillars with the c-axis perpendicular to the load direction tended to possess higher strain to failure and lower Young’s modulus. Measured Young’s modulus from micropillar compression was compared with results from nanoindentation measurements. The modulus values from micropillar compression were consistently smaller than those from nanoindentation measurements.

Dont have a licence yet? Then find out more about our products and how to get one now:

Springer Professional "Wirtschaft+Technik"

Online-Abonnement

Mit Springer Professional "Wirtschaft+Technik" erhalten Sie Zugriff auf:

  • über 102.000 Bücher
  • über 537 Zeitschriften

aus folgenden Fachgebieten:

  • Automobil + Motoren
  • Bauwesen + Immobilien
  • Business IT + Informatik
  • Elektrotechnik + Elektronik
  • Energie + Nachhaltigkeit
  • Finance + Banking
  • Management + Führung
  • Marketing + Vertrieb
  • Maschinenbau + Werkstoffe
  • Versicherung + Risiko

Jetzt Wissensvorsprung sichern!

Springer Professional "Technik"

Online-Abonnement

Mit Springer Professional "Technik" erhalten Sie Zugriff auf:

  • über 67.000 Bücher
  • über 390 Zeitschriften

aus folgenden Fachgebieten:

  • Automobil + Motoren
  • Bauwesen + Immobilien
  • Business IT + Informatik
  • Elektrotechnik + Elektronik
  • Energie + Nachhaltigkeit
  • Maschinenbau + Werkstoffe




 

Jetzt Wissensvorsprung sichern!

Literature
1.
go back to reference Agarwal R, Zhang W, Limaye P, Labie R, Dimcic B, Phommahaxay A, Soussan P (2010) Cu/Sn microbumps interconnect for 3D TSV chip stacking. In: 2010 Proceedings 60th electronic components and technology conference (ECTC), 1–4 June 2010, pp 858–863. doi:10.1109/ECTC.2010.5490698 Agarwal R, Zhang W, Limaye P, Labie R, Dimcic B, Phommahaxay A, Soussan P (2010) Cu/Sn microbumps interconnect for 3D TSV chip stacking. In: 2010 Proceedings 60th electronic components and technology conference (ECTC), 1–4 June 2010, pp 858–863. doi:10.​1109/​ECTC.​2010.​5490698
2.
go back to reference Yu A, Lau JH, Ho SW, Kumar A, Hnin WY, Yu D-Q, Jong MC, Kripesh V, Pinjala D, Kwong D-L (2009) Study of 15 μm pitch solder microbumps for 3D IC integration. In: 59th Electronic components and technology conference, 2009 (ECTC 2009), 26–29 May 2009, pp 6–10. doi:10.1109/ECTC.2009.5073988 Yu A, Lau JH, Ho SW, Kumar A, Hnin WY, Yu D-Q, Jong MC, Kripesh V, Pinjala D, Kwong D-L (2009) Study of 15 μm pitch solder microbumps for 3D IC integration. In: 59th Electronic components and technology conference, 2009 (ECTC 2009), 26–29 May 2009, pp 6–10. doi:10.​1109/​ECTC.​2009.​5073988
3.
go back to reference Chen HY, Shih DY, Wei CC, Tung CH, Hsiao YL, Yu DCH, Liang YC, Chen C (2013) Generic rules to achieve bump electromigration immortality for 3D IC integration. In: 2013 IEEE 63rd electronic components and technology conference (ECTC), 28–31 May 2013, pp 49–57. doi:10.1109/ECTC.2013.6575549 Chen HY, Shih DY, Wei CC, Tung CH, Hsiao YL, Yu DCH, Liang YC, Chen C (2013) Generic rules to achieve bump electromigration immortality for 3D IC integration. In: 2013 IEEE 63rd electronic components and technology conference (ECTC), 28–31 May 2013, pp 49–57. doi:10.​1109/​ECTC.​2013.​6575549
4.
go back to reference Yoon SW, Ku JH, Suthiwongsunthorn N, Marimuthu PC, Carson F (2009) Fabrication and packaging of microbump interconnections for 3D TSV. In: IEEE international conference on 3D system integration, 2009 (3DIC 2009), 28–30 Sept. 2009, pp 1–5. doi:10.1109/3DIC.2009.5306554 Yoon SW, Ku JH, Suthiwongsunthorn N, Marimuthu PC, Carson F (2009) Fabrication and packaging of microbump interconnections for 3D TSV. In: IEEE international conference on 3D system integration, 2009 (3DIC 2009), 28–30 Sept. 2009, pp 1–5. doi:10.​1109/​3DIC.​2009.​5306554
5.
go back to reference Chuang HY, Yang TL, Kuo MS, Chen YJ, Yu JJ, Li CC, Kao CR (2012) Critical concerns in soldering reactions arising from space confinement in 3-D IC packages. IEEE Trans Device Mater Reliab 12(2):233–240. doi:10.1109/tdmr.2012.2185239 CrossRef Chuang HY, Yang TL, Kuo MS, Chen YJ, Yu JJ, Li CC, Kao CR (2012) Critical concerns in soldering reactions arising from space confinement in 3-D IC packages. IEEE Trans Device Mater Reliab 12(2):233–240. doi:10.​1109/​tdmr.​2012.​2185239 CrossRef
11.
go back to reference Jiang L, Jiang H, Chawla N (2012) The effect of crystallographic orientation on the mechanical behavior of Cu6Sn5 by micropillar compression testing. J Electron Mater 41(8):2083–2088. doi:10.1007/s11664-012-2124-4 CrossRef Jiang L, Jiang H, Chawla N (2012) The effect of crystallographic orientation on the mechanical behavior of Cu6Sn5 by micropillar compression testing. J Electron Mater 41(8):2083–2088. doi:10.​1007/​s11664-012-2124-4 CrossRef
13.
go back to reference Fei H, Abraham A, Chawla N, Jiang H (2012) Evaluation of micro-pillar compression tests for accurate determination of elastic–plastic constitutive relations. J Appl Mech 79(6):061011. doi:10.1115/1.4006767 CrossRef Fei H, Abraham A, Chawla N, Jiang H (2012) Evaluation of micro-pillar compression tests for accurate determination of elastic–plastic constitutive relations. J Appl Mech 79(6):061011. doi:10.​1115/​1.​4006767 CrossRef
16.
17.
go back to reference Simmons G, Wand H (1971) Single crystal elastic constants and calculated aggregate properties: a handbook. MIT Press, Cambridge Simmons G, Wand H (1971) Single crystal elastic constants and calculated aggregate properties: a handbook. MIT Press, Cambridge
19.
go back to reference Pharr GM, Oliver WC, Brotzen FR (1992) On the generality of the relationship among contact stiffness, contact area, and elastic modulus during indentation. J Mater Res 7(03):613–617. doi:10.1557/JMR.1992.0613 CrossRef Pharr GM, Oliver WC, Brotzen FR (1992) On the generality of the relationship among contact stiffness, contact area, and elastic modulus during indentation. J Mater Res 7(03):613–617. doi:10.​1557/​JMR.​1992.​0613 CrossRef
20.
go back to reference Larsson AK, Stenberg L, Lidin S (1995) Crystal structure modulations in eta-Cu5Sn4. Z Kristallogr 210:832–837 Larsson AK, Stenberg L, Lidin S (1995) Crystal structure modulations in eta-Cu5Sn4. Z Kristallogr 210:832–837
22.
go back to reference Cabarat R, Guillet L, Roux LE (1949) The elastic properties of metallic alloys. J Inst Met 75:391–402 Cabarat R, Guillet L, Roux LE (1949) The elastic properties of metallic alloys. J Inst Met 75:391–402
23.
go back to reference Subrahmanyam B (1972) Elastic moduli of some complicated binary alloy systems. Trans Jpn Inst Met 13(2):93–95CrossRef Subrahmanyam B (1972) Elastic moduli of some complicated binary alloy systems. Trans Jpn Inst Met 13(2):93–95CrossRef
24.
go back to reference Ostrovskaya L, Rodin V, Kuznetsov A (1985) Elastic properties of intermetallic compounds produced by vacuum deposition. Sov J Non-Ferr Met 26(3):90–91 Ostrovskaya L, Rodin V, Kuznetsov A (1985) Elastic properties of intermetallic compounds produced by vacuum deposition. Sov J Non-Ferr Met 26(3):90–91
25.
go back to reference Field RJ, Low SR 3rd, Lucey JGK (1991) Physical and mechanical of intermetallic compounds commonly found in solder joints. In: 1991 Proceedings of TMS symposium, 20–24 October 1991, pp 165–174 Field RJ, Low SR 3rd, Lucey JGK (1991) Physical and mechanical of intermetallic compounds commonly found in solder joints. In: 1991 Proceedings of TMS symposium, 20–24 October 1991, pp 165–174
26.
go back to reference Chromik RR, Vinci RP, Allen SL, Notis MR (2003) Nanoindentation measurements on Cu–Sn and Ag–Sn intermetallics formed in Pb-free solder joints. J Mater Res 18(09):2251–2261. doi:10.1557/JMR.2003.0314 CrossRef Chromik RR, Vinci RP, Allen SL, Notis MR (2003) Nanoindentation measurements on Cu–Sn and Ag–Sn intermetallics formed in Pb-free solder joints. J Mater Res 18(09):2251–2261. doi:10.​1557/​JMR.​2003.​0314 CrossRef
28.
29.
go back to reference Tsukamoto H, Dong Z, Huang H, Nishimura T, Nogita K (2009) Nanoindentation characterization of intermetallic compounds formed between Sn–Cu (–Ni) ball grid arrays and Cu substrates. Mater Sci Eng B 164(1):44–50. doi:10.1016/j.mseb.2009.06.013 CrossRef Tsukamoto H, Dong Z, Huang H, Nishimura T, Nogita K (2009) Nanoindentation characterization of intermetallic compounds formed between Sn–Cu (–Ni) ball grid arrays and Cu substrates. Mater Sci Eng B 164(1):44–50. doi:10.​1016/​j.​mseb.​2009.​06.​013 CrossRef
30.
go back to reference Lotfian S, Molina-Aldareguia JM, Yazzie KE, Llorca J, Chawla N (2013) Mechanical characterization of lead-free Sn–Ag–Cu solder joints by high-temperature nanoindentation. J Electron Mater 42(6):1085–1091. doi:10.1007/s11664-013-2517-z CrossRef Lotfian S, Molina-Aldareguia JM, Yazzie KE, Llorca J, Chawla N (2013) Mechanical characterization of lead-free Sn–Ag–Cu solder joints by high-temperature nanoindentation. J Electron Mater 42(6):1085–1091. doi:10.​1007/​s11664-013-2517-z CrossRef
32.
go back to reference Song JM, Huang BR, Liu CY, Lai YS, Chiu YT, Huang TW (2012) Nanomechanical responses of intermetallic phase at the solder joint interface—crystal orientation and metallurgical effects. Mater Sci Eng A 534:53–59. doi:10.1016/j.msea.2011.11.037 CrossRef Song JM, Huang BR, Liu CY, Lai YS, Chiu YT, Huang TW (2012) Nanomechanical responses of intermetallic phase at the solder joint interface—crystal orientation and metallurgical effects. Mater Sci Eng A 534:53–59. doi:10.​1016/​j.​msea.​2011.​11.​037 CrossRef
33.
go back to reference Yang PF, Lai YS, Jian SR, Chen J, Chen RS (2008) Nanoindentation identifications of mechanical properties of Cu6Sn5, Cu3Sn, and Ni3Sn4 intermetallic compounds derived by diffusion couples. Mater Sci Eng A 485(1–2):305–310. doi:10.1016/j.msea.2007.07.093 CrossRef Yang PF, Lai YS, Jian SR, Chen J, Chen RS (2008) Nanoindentation identifications of mechanical properties of Cu6Sn5, Cu3Sn, and Ni3Sn4 intermetallic compounds derived by diffusion couples. Mater Sci Eng A 485(1–2):305–310. doi:10.​1016/​j.​msea.​2007.​07.​093 CrossRef
Metadata
Title
Micromechanical behavior of single-crystalline Cu6Sn5 by picoindentation
Authors
J. J. Yu
J. Y. Wu
L. J. Yu
H. W. Yang
C. R. Kao
Publication date
02-03-2017
Publisher
Springer US
Published in
Journal of Materials Science / Issue 12/2017
Print ISSN: 0022-2461
Electronic ISSN: 1573-4803
DOI
https://doi.org/10.1007/s10853-017-0952-6

Other articles of this Issue 12/2017

Journal of Materials Science 12/2017 Go to the issue

Premium Partners