Issue 5/2018
Content (10 Articles)
An Efficient SAT-Based Test Generation Algorithm with GPU Accelerator
Muhammad Osama, Lamya Gaber, Aziza I. Hussein, Hanafy Mahmoud
Real Time Fault Diagnosis with Tests of Uncertain Quality for Multimode Systems and its Application in a Satellite Power System
Shigang Zhang, Long Wang, Ying Liu, Xiaofei Zhang, Yongmin Yang
Methodical Approach for Immunity Assessment of Electronic Devices Excited by High Power EMP
Vladimir Chepelev, Yury Parfenov, William Radasky, Boris Titov, Leonid Zdoukhov, Kejie Li, Yuhao Chen, Xu Kong, Yan-zhao Xie
Fault Leveling Techniques for Yield and Reliability Enhancement of NAND Flash Memories
Shyue-Kung Lu, Shang-Xiu Zhong, Masaki Hashizume
Exploiting Multi-Phase On-Chip Voltage Regulators as Strong PUF Primitives for Securing IoT
Weize Yu, Yiming Wen, Selçuk Köse, Jia Chen
Analytical Low Frequency NBTI Compact Modeling with H2 Locking and Electron Fast Capture and Emission
J. Qing, Y. Zeng, X. J. Li, P. J. Zhang, Y. B. Sun, Y. L. Shi
High Performance Modified Static Segment Approximate Multiplier based on Significance Probability
R. Jothin, C. Vasanthanayaki