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1996 | OriginalPaper | Buchkapitel

A Microwave Transducer for Detecting Conductive Surfaces Beneath Protective Coatings

verfasst von : Stephen C. Buckner, John J. Domalewski, Garrett G. Heil, Jeffrey K. Hoyt, Arthur C. Lind, Frederick C. Wear

Erschienen in: Review of Progress in Quantitative Nondestructive Evaluation

Verlag: Springer US

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This paper describes a new device, named the EMI Tester, that nondestructively detects the conductivity of surfaces beneath protective paint of varying thickness. This device utilizes a microwave stripline placed in contact with the surface to detect surface conductivity. It provides field maintenance personnel with an easy way to evaluate the EMI configuration of aircraft outer moldline surfaces. The device is small enough to be hand-held by service personnel and compatible with the field service environment.

Metadaten
Titel
A Microwave Transducer for Detecting Conductive Surfaces Beneath Protective Coatings
verfasst von
Stephen C. Buckner
John J. Domalewski
Garrett G. Heil
Jeffrey K. Hoyt
Arthur C. Lind
Frederick C. Wear
Copyright-Jahr
1996
Verlag
Springer US
DOI
https://doi.org/10.1007/978-1-4613-0383-1_91

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