1996 | OriginalPaper | Buchkapitel
A Microwave Transducer for Detecting Conductive Surfaces Beneath Protective Coatings
verfasst von : Stephen C. Buckner, John J. Domalewski, Garrett G. Heil, Jeffrey K. Hoyt, Arthur C. Lind, Frederick C. Wear
Erschienen in: Review of Progress in Quantitative Nondestructive Evaluation
Verlag: Springer US
Enthalten in: Professional Book Archive
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This paper describes a new device, named the EMI Tester, that nondestructively detects the conductivity of surfaces beneath protective paint of varying thickness. This device utilizes a microwave stripline placed in contact with the surface to detect surface conductivity. It provides field maintenance personnel with an easy way to evaluate the EMI configuration of aircraft outer moldline surfaces. The device is small enough to be hand-held by service personnel and compatible with the field service environment.