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Erschienen in:
2009 | OriginalPaper | Buchkapitel
A Random Extension for Discriminative Dimensionality Reduction and Metric Learning
verfasst von : Adrian Perez-Suay, Francesc J. Ferri, Jesús V. Albert
Erschienen in: Pattern Recognition and Image Analysis
Verlag: Springer Berlin Heidelberg
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A recently proposed metric learning algorithm which enforces the optimal discrimination of the different classes is extended and empirically assessed using different kinds of publicly available data. The optimization problem is posed in terms of landmark points and then, a stochastic approach is followed in order to bypass some of the problems of the original algorithm. According to the results, both computational burden and generalization ability are improved while absolute performance results remain almost unchanged.