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Erschienen in:
2014 | OriginalPaper | Buchkapitel
A Simulated Fault Injection Framework for Time-Triggered Safety-Critical Embedded Systems
verfasst von : Iban Ayestaran, Carlos F. Nicolas, Jon Perez, Asier Larrucea, Peter Puschner
Erschienen in: Computer Safety, Reliability, and Security
Verlag: Springer International Publishing
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This paper presents a testing and simulated fault injection framework for time-triggered safety-critical embedded systems. Our approach facilitates the validation of fault-tolerance mechanisms by performing non-intrusive (SFI) on models of the system at different stages of the development, from the (PIM) to the (PSM). The SFI enables exercising the intended fault tolerance mechanisms by injecting faults in a simulated model of a system. The main benefit of this work is that it enables an early detection of design flaws in fault-tolerant systems, what reduces the possibility of late discovery of design pitfalls that might require an expensive redesign of the system. We examine the feasibility of the proposed approach in a case study, where SFI is used to assess the fault tolerance mechanisms designed in a simplified railway signaling system.