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Erschienen in:
1984 | OriginalPaper | Buchkapitel
A Study by Low Energy SIMS of Chromium Behavior in an Oxide Film of Low-Chromium Steel
verfasst von : S. Yamaguchi, T. Kikuchi, K. Furuya
Erschienen in: Secondary Ion Mass Spectrometry SIMS IV
Verlag: Springer Berlin Heidelberg
Enthalten in: Professional Book Archive
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Chromium has an important role for passivation of metal surfaces. Many researchers have studied the composition and structure of oxide film on the surface of various kinds of iron-chromium alloys by means of XPS [1], AES [2, 3], ISS [4] and SIMS [5]. These surface analyzing methods afford to give information on the topmost surfaces. Tjong et al. [3] have studied the alloys (Cr; 3, 9, 12 and 18%) and found the bulk compositions of these alloys may bring significant changes of growth rate of oxide on them. Buczek et al. [2] also reported that the thickness of oxide was reduced as chromium content in an alloy increased.