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Erschienen in:
Introduction to Wearout Kapitel lesen Erstes Kapitel lesen

2020 | OriginalPaper | Buchkapitel

5. Active Accelerated Self-healing as a Key Design Knob for Cross-Layer Resilience

verfasst von : Xinfei Guo, Mircea R. Stan

Erschienen in: Circadian Rhythms for Future Resilient Electronic Systems

Verlag: Springer International Publishing

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Abstract

Cross-layer resiliency is a closer to optimal way of maximizing reliability by breaking the abstraction layers boundaries across the system stack. In this chapter, we discuss how accelerated and active self-healing methods can be effectively applied at different levels in the system hierarchy. Circuit blocks that were presented in the previous chapter serve as the underlying infrastructure for recovery; at the architecture level, unit-level self-healing and intrinsic heat reduce the hardware costs for recovery through architectural opportunities; at the system level, scheduling that follows certain circadian rhythm can be implemented to deeply heal the circuit. Overall, these techniques can work together and compensate the trade-offs necessary for recovery.

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Vorheriges Kapitel Circuit Techniques for BTI and EM Accelerated and Active Recovery
Nächstes Kapitel Design and Aging Challenges in FinFET Circuits and Internet of Things (IoT) Applications
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Metadaten
Titel
Active Accelerated Self-healing as a Key Design Knob for Cross-Layer Resilience
verfasst von
Xinfei Guo
Mircea R. Stan
Copyright-Jahr
2020
Buch
Circadian Rhythms for Future Resilient Electronic Systems

Print ISBN: 978-3-030-20050-3

Electronic ISBN: 978-3-030-20051-0

Copyright-Jahr: 2020

DOI
https://doi.org/10.1007/978-3-030-20051-0_5

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