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Metals and Materials International

Erschienen in:

11.03.2023

Application of k-Means Clustering to Material Research: Measurement of Layer Thickness and Contact Angle

verfasst von: Dong-Jun Lee, Yong-Min Cho, Jun Hyun Kim, In-Jun Hwang, Yongsug Chung, Youn-Bae Kang

Erschienen in: Metals and Materials International | Ausgabe 9/2023

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Abstract

A new method of measuring material properties such as thickness or contact angle from recorded images is presented. A usual inspection of the image largely depends on the human decision for the boundary determination, which could induce the result to be biased. The present study proposes to use “k-means clustering”, which is a method of vector quantization. The image was digitized, and the digitized data were categorized into several clusters (three in case of the thickness measurement, two in case of the contact angle measurement) as objective as possible. It was shown that this method is reliable and does not require any human decision, except for the number of clusters. The low-resolution image was well treated by the present method, which was not possible in other conventional methods.

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Vorheriger Artikel Study on In-Situ Nucleation, Growth Kinetics and Crystallographic Structure of Acicular Ferrite in X100 Pipeline Steel Welds

Nächster Artikel Grain Boundary-Mediated Reduction of Radiation Defects in Different W-Based Alloys

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Titel: Application of k-Means Clustering to Material Research: Measurement of Layer Thickness and Contact Angle
verfasst von: Dong-Jun Lee
Yong-Min Cho
Jun Hyun Kim
In-Jun Hwang
Yongsug Chung
Youn-Bae Kang
Publikationsdatum: 11.03.2023
Verlag: The Korean Institute of Metals and Materials
Erschienen in: Metals and Materials International / Ausgabe 9/2023
Print ISSN: 1598-9623
Elektronische ISSN: 2005-4149
DOI: https://doi.org/10.1007/s12540-023-01411-z

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