Assessment of Storage Reliability for Accelerometer Based on Pseudo-Stable Data

Because of the slow parameter drifting and the long testing time in storage environment, the life test has failed to meet the actual needs in normal environment, so it is difficult to assess the reliability of the product accurately. The power function degradation model and the Arrhenius acceleration model are introduced in the paper based on the degradation mechanism of accelerometer parameters, and a generalized analysis method of high reliable and long life is also proposed under the pseudo-stable condition obeying the log-normal distribution and the Weibull distribution. The experiments proved that the proposed method can overcome the disadvantage in reliability assessment for traditional accelerated data, eliminate the defect of the accelerometer reliability interval evaluation, and improve the accuracy and stability of the reliability index, so it has higher cost-effectiveness ratio.